Charge Reorganization Energy and Small Polaron Binding Energy of Rubrene Thin Films by Ultraviolet Photoelectron Spectroscopy

2012 ◽  
Vol 24 (7) ◽  
pp. 901-905 ◽  
Author(s):  
Steffen Duhm ◽  
Qian Xin ◽  
Shunsuke Hosoumi ◽  
Hirohiko Fukagawa ◽  
Kazushi Sato ◽  
...  
1999 ◽  
Vol 561 ◽  
Author(s):  
U. Theissl ◽  
E.J.W. List ◽  
N. Koch ◽  
A. Vollmer ◽  
S. Schrader ◽  
...  

ABSTRACTThin films of p-sexiphenyl (6P) were doped with increasing amounts of potassium in situ, and the change in the valence electronic structure of 6P upon the alkali metal deposition was followed with ultraviolet photoelectron spectroscopy. We observe the evolution of new intragap emissions, which are attributed to the formation of bipolarons, even for very low doping concentrations. The low binding energy intra-gap emission exhibits a pronounced asymmetric lineshape, in contrast to the findings when cesium is used as dopant. In order to investigate whether this lineshape is due to different emissive electronic species in the bulk and on the surface of the 6P film the take-off angle for the photoelectrons was varied. As no change in the lineshape is found when going from normal to near-grazing emission we can exclude that charged 6P molecules in the bulk and on the surface yield different valence electronic spectra. Therefore, the characteristic lineshape of the low binding energy emission is proposed to be related to the interaction of the doped organic molecule with the different counterions.


2002 ◽  
Vol 09 (02) ◽  
pp. 865-869
Author(s):  
M. SAWADA ◽  
K. HAYASHI ◽  
A. KAKIZAKI

We have investigated electronic and magnetic properties of Co thin films epitaxially grown on Au(111) and Pd(111) substrates by spin- and angle-resolved photoelectron spectroscopy. In the Co/Au(111) system, the magnetization direction of Co changes from perpendicular to parallel to the surface at about 6 ML. The origin of the reorientation is qualitatively explained by the increasing contribution of Co 3d orbitals perpendicular to the surface. In the Co/Pd(111) system, the reorientation of the magnetization direction occurs at about 4 ML, the origin of which is explained as being due to the contribution of the upper Λ3 band of Co with increase of film thickness as in the case of the Co/Au(111) system. The stronger hybridization between Co 3d and Pd 4d states in the Co/Pd(111) system causes larger binding energy shifts of the Λ3 states than in the Co/Au(111) system.


2015 ◽  
Vol 16 (1) ◽  
pp. 13
Author(s):  
Iwan Sugihartono ◽  
Esmar Budi ◽  
Agus Setyo Budi

Undoped ZnO and ZnO:Er  thin films were deposited on p-type Si substrates by ultrasonic spray pyrolisis (USP). Undoped and ZnO:Er thin films have been analyzed by using X-ray Photoelectron Spectroscopy (XPS). The results show that the XPS spectrum has two Er peak at ∼157 eV and ∼168 eV. The XPS Zn 2p spectrum of undoped ZnO and ZnO:Er thin films have binding energy for Zn 2p3/2 (~ 1021 eV) and Zn 2p1/2 (~1045eV) were found no shift in binding energy after the incorporation of Er. Meanwhile, after Er incorporates into ZnO, the O 1s spectrum is composed two peak of binding energy (BE) at ~530.5eV and the shoulder about 532.5 eV.Keywords: ZnO thin films, ZnO:Er, XPS, binding energy


2021 ◽  
Author(s):  
Ghada El Jamal ◽  
Thomas Gouder ◽  
Rachel Eloirdi ◽  
Mats Jonsson

We report surface characteristics of UO2, U2O5 and UO3 thin films after exposure to gas plasmas: a new approach of the oxidative dissolution problem.


2012 ◽  
Vol 549 ◽  
pp. 720-723
Author(s):  
Bo Cao ◽  
Tong Rui Yang ◽  
Gong Ping Li ◽  
Seong Jin Cho ◽  
Hee Kim

The Cu thin films were deposited on P type Si (111) substrates by ionized cluster beam (ICB) technique. The surface properties and atomic binding energy of Cu thin films were studied by X-ray Photoelectron Spectroscopy (XPS). The results show that for all XPS spectra of Cu/SiO2/Si (111) samples deposited by neutral cluster and ionized cluster beam (Va=5 kV), the atomic binding energy of the films was no differences with bulk materials. The reason may be that the local energy deposition and atomic restructuring caused by surface treatment process resulting in the XPS spectra of the copper films was similar with bulk standard copper.


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