Depth profiling of tritium in solids with the nuclear reaction induced by deuteron bombardment

1983 ◽  
Vol 54 (11) ◽  
pp. 6790-6791 ◽  
Author(s):  
Shuichi Okuda ◽  
Ryoichi Taniguchi ◽  
Masatoshi Fujishiro ◽  
Yuji Satoh ◽  
Eiichi Hiraoka
2008 ◽  
Author(s):  
John Kennedy ◽  
Peter Murmu ◽  
Andreas Markwitz ◽  
Edmund G. Seebauer ◽  
Susan B. Felch ◽  
...  

1993 ◽  
Vol 316 ◽  
Author(s):  
Oleg I. Zabashta ◽  
A.I. Kul'ment'ev ◽  
V.E. Storizko

The general problem in the analysis of a sample by non-destructive techniques such as nuclear microanalysis, ellipsometry, etc. is the interpretation of the measured data. The impurity depth profile obtained may noticeable non-physical fluctuations. From the mathematical point of view this could be explain by the fact that while interpreting the results we have to solve an incorrect problem to which routine computational methods are not applicable.


Author(s):  
Patrick Trocellier ◽  
Dominique Gosset ◽  
David Simeone ◽  
Jean Marc Costantini ◽  
Xavier Deschanels ◽  
...  

Author(s):  
G.L.N. Reddy ◽  
Sanjiv Kumar ◽  
S. Vikram Kumar ◽  
J.V. Ramana ◽  
S. Veena ◽  
...  

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