Depth profiling of tritium in solids with the nuclear reaction induced by deuteron bombardment
2005 ◽
Vol 232
(1-4)
◽
pp. 280-284
◽
High resolution depth profiling in silicon oxynitride films using narrow nuclear reaction resonances
1998 ◽
Vol 136-138
◽
pp. 521-527
◽
1988 ◽
Vol 34
(4)
◽
pp. 465-469
◽
1986 ◽
Vol 15
(1-6)
◽
pp. 559-562
◽
2003 ◽
Vol 206
◽
pp. 1077-1082
◽
2008 ◽
Vol 266
(14)
◽
pp. 3281-3289
◽