Laser generated guided waves and finite element modeling for the thickness gauging of thin layers

2010 ◽  
Vol 81 (3) ◽  
pp. 034901 ◽  
Author(s):  
F. Lefevre ◽  
F. Jenot ◽  
M. Ouaftouh ◽  
M. Duquennoy ◽  
M. Ourak
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Guided Waves ◽  
Thin Layers ◽  
Element Modeling ◽  
Thickness Gauging

scholarly journals Evaluating Mechanical Properties of Thin Layers using Nanoindentation and Finite-Element Modeling: Implanted Metals and Deposited Layers

1996 ◽  
Vol 438 ◽  
Author(s):  
J. A. Knapp ◽  
D. M. Follstaedt ◽  
J. C. Barbour ◽  
S. M. Myers ◽  
J. W. Ager ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Finite Element ◽  
Finite Element Modeling ◽  
Yield Stress ◽  
Young’S Modulus ◽  
Layer Thickness ◽  
Young's Modulus ◽  
Thin Layers ◽  
Element Modeling ◽  
Surface Modified

AbstractWe present a methodology based on finite-element modeling of nanoindentation data to extract reliable and accurate mechanical properties from thin, hard films and surface-modified layers on softer substrates. The method deduces the yield stress, Young's modulus, and hardness from indentations as deep as 50% of the layer thickness.

Hall–Petch relationship in pulsed-laser deposited nickel films

2004 ◽  
Vol 19 (1) ◽  
pp. 218-227 ◽  
Author(s):  
J.A. Knapp ◽  
D.M. Follstaedt
Keyword(s):  
Mechanical Properties ◽  
Finite Element ◽  
Finite Element Modeling ◽  
Pulsed Laser ◽  
Fused Silica ◽  
Thin Layers ◽  
Element Modeling ◽  
Petch Relationship ◽  
Grain Sizes ◽  
Dislocation Movement

Thin-film mechanical properties can be measured using nanoindentation combined with detailed finite element modeling. This technique was used for a study of very fine grained Ni films, formed using pulsed-laser deposition on fused silica, sapphire, and Ni substrates. The grain sizes in the films were characterized by electron microscopy, and the mechanical properties were determined by ultra-low load indentation, analyzed using finite element modeling to separate the mechanical properties of the thin layers from those of the substrates. Some Ni films were deposited at high temperature or annealed after deposition to enlarge the grain sizes. The observed hardnesses and grain sizes in these thin Ni films are consistent with the empirical Hall–Petch relationship for grain sizes ranging from a few micrometers to as small as 10 nm, suggesting that deformation occurs preferentially by dislocation movement even in such nanometer-size grains.

Exact First Order Finite Element Modeling for Eddy Current NDE

1991 ◽  
Vol 3 (1) ◽  
pp. 235-253 ◽  
Author(s):  
L. D. Philipp ◽  
Q. H. Nguyen ◽  
D. D. Derkacht ◽  
D. J. Lynch ◽  
A. Mahmood
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Eddy Current ◽  
Element Modeling ◽  
First Order ◽  
Eddy Current Nde
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