Trapping effects in Al2O3/AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistor investigated by temperature dependent conductance measurements

2010 ◽  
Vol 96 (1) ◽  
pp. 013505 ◽  
Author(s):  
P. Kordoš ◽  
R. Stoklas ◽  
D. Gregušová ◽  
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J. Novák
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Vol 37 (11) ◽  
pp. 715 ◽  
Author(s):  
T. Rotter ◽  
D. Mistele ◽  
J. Stemmer ◽  
M. Seyboth ◽  
V. Schwegler ◽  
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Author(s):  
M.A. Khan ◽  
X. Hu ◽  
G. Sumin ◽  
A. Lunev ◽  
J. Yang ◽  
...  

2002 ◽  
Vol 41 (Part 2, No. 7A) ◽  
pp. L748-L750 ◽  
Author(s):  
Dei-Wei Chou ◽  
Kuan-Wei Lee ◽  
Jian-Jun Huang ◽  
Hou-Run Wu ◽  
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...  

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