Trapping effects in Al2O3/AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistor investigated by temperature dependent conductance measurements
2012 ◽
Vol 51
(3R)
◽
pp. 034101
◽
2013 ◽
Vol 55
◽
pp. 8-15
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2007 ◽
Vol 154
(2)
◽
pp. H119
◽
2002 ◽
Vol 41
(Part 2, No. 7A)
◽
pp. L748-L750
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2012 ◽
Vol 51
◽
pp. 034101
◽