scholarly journals Polarization switching characteristics of BiFeO3 thin films epitaxially grown on Pt/MgO at a low temperature

2009 ◽  
Vol 95 (24) ◽  
pp. 242902 ◽  
Author(s):  
Sangwoo Ryu ◽  
Jong Yeog Son ◽  
Young-Han Shin ◽  
Hyun M. Jang ◽  
James F. Scott
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Polarization Switching ◽  
Bifeo3 Thin Films ◽  
Switching Characteristics

Local polarization switching in Ba–Ni co-doped BiFeO3 thin films with low rhombohedral-symmetry distortion

2015 ◽  
Vol 51 (5) ◽  
pp. 2283-2291 ◽  
Author(s):  
G. Rojas-George ◽  
A. Concha-Balderrama ◽  
H. Esparza-Ponce ◽  
J. Silva ◽  
J. T. Elizalde Galindo ◽  
...  
Keyword(s):  
Thin Films ◽  
Polarization Switching ◽  
Bifeo3 Thin Films ◽  
Local Polarization ◽  
Rhombohedral Symmetry ◽  
Co Doped

scholarly journals Nanocrystalline Ferroelectric BiFeO3 Thin Films by Low-Temperature Atomic Layer Deposition

2015 ◽  
Vol 27 (18) ◽  
pp. 6322-6328 ◽  
Author(s):  
Mariona Coll ◽  
Jaume Gazquez ◽  
Ignasi Fina ◽  
Zakariya Khayat ◽  
Andy Quindeau ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Bifeo3 Thin Films ◽  
Layer Deposition

Polarization-switching pathway determined electrical transport behaviors in rhombohedral BiFeO3 thin films

Nanoscale ◽  
2021 ◽  
Author(s):  
Jing Wang ◽  
Huayu Yang ◽  
Yue Wang ◽  
Yuanyuan Fan ◽  
Di Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Transport ◽  
Point Contact ◽  
Rhombohedral Phase ◽  
Polarization Switching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bifeo3 Thin Films ◽  
Piezoelectric Force Microscopy

We investigate the polarization-switching pathway dependent electrical transport behaviors in rhombohedral-phase BiFeO3 thin films with a point contact geometry. By combining conducting-atomic force microscopy and piezoelectric force microscopy, we simultaneously...

Enhanced Polarization Switching Characteristics of Pb(Zr0.5Ti0.5)O3–Pt Nanocomposite Thin Films

2004 ◽  
Vol 19 (4) ◽  
pp. 1043-1049 ◽  
Author(s):  
Cheng-Wei Cheng ◽  
Yuan-Chieh Tseng ◽  
Tai-Bor Wu ◽  
Li-Jen Chou
Keyword(s):  
Thin Films ◽  
Single Layer ◽  
Polarization Switching ◽  
Nano Particles ◽  
Nanocomposite Films ◽  
Pzt Film ◽  
Nanocomposite Thin Films ◽  
Switching Characteristics ◽  
Pt Films ◽  
Nanocomposite Structures

The effect of nanoscale Pt particles embedded in ferroelectric matrix on the polarization switching characteristics of Pb(Zr0.5Ti0.5)O3(PZT) thin films of low thickness was investigated. Two different nanocomposite structures of PZT-Pt thin films were fabricated for the study. The first one incorporated a single layer of Pt nano-particles embedded in the PZT film, which was formed by annealing an ultrathin Pt layer that had been inserted into the middle of the deposited PZT. The other one had Pt nano-particles embedded uniformly and coherently in the lattice of the PZT matrix, which was generated by annealing the cosputtered films of PZT and Pt. The electric field applied on the films can be locally intensified near the embedded Pt particles, which markedly enhances the polarization switching characteristic of the above PZT-Pt nanocomposite films. Accordingly, a satisfactorily higher remanent polarization was obtained than exhibited by normal PZT films, but the coercive field was only slightly higher. However, adding an excess of Pt made the nanocomposite films too leaky to exhibit the enhancement. Moreover, the nanocomposite PZT-Pt films in the capacitor configuration of Pt/LaNiO3/PZT-Pt/LaNiO3/Pt also exhibited highly reliable polarization retention and fatigue resistance.

Visualization of photoassisted polarization switching and its consequences in BiFeO3 thin films probed by terahertz radiation

2007 ◽  
Vol 91 (3) ◽  
pp. 031909 ◽  
Author(s):  
D. S. Rana ◽  
K. Takahashi ◽  
K. R. Mavani ◽  
I. Kawayama ◽  
H. Murakami ◽  
...  
Keyword(s):  
Thin Films ◽  
Terahertz Radiation ◽  
Polarization Switching ◽  
Bifeo3 Thin Films

X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperature Using Synchrotron Radiation

2011 ◽  
Vol 59 (3(1)) ◽  
pp. 2556-2559 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hironori Fujisawa ◽  
Jung Min Park ◽  
Takeshi Kanashima ◽  
...  
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Low Temperature ◽  
Electric Field ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bifeo3 Thin Films

Polarization switching characteristics of vinylidene fluoride/tefrafluoroethylene copolymer thin films

2015 ◽  
Vol 54 (10S) ◽  
pp. 10NA09 ◽  
Author(s):  
Yuuta Nakagawa ◽  
Yoichiro Hashizume ◽  
Takashi Nakajima ◽  
Soichiro Okamura
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Polarization Switching ◽  
Switching Characteristics
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