Purified Si film formation from metallurgical-grade Si by hydrogen plasma induced chemical transport

2009 ◽  
Vol 95 (18) ◽  
pp. 181506 ◽  
Author(s):  
Hiromasa Ohmi ◽  
Akihiro Goto ◽  
Daiki Kamada ◽  
Yoshinori Hamaoka ◽  
Hiroaki Kakiuchi ◽  
...  
2007 ◽  
Vol 102 (2) ◽  
pp. 023302 ◽  
Author(s):  
Hiromasa Ohmi ◽  
Hiroaki Kakiuchi ◽  
Yoshinori Hamaoka ◽  
Kiyoshi Yasutake

1985 ◽  
Vol 4 (1) ◽  
pp. 51-54 ◽  
Author(s):  
Shojiro Komatsu ◽  
Toyonobu Yoshida ◽  
Kazuo Akashi

1995 ◽  
Vol 4 (10) ◽  
pp. 1200-1204
Author(s):  
V.G. Babaev ◽  
M.B. Guseva ◽  
A.Yu. Bregadze ◽  
V.V. Khvostov ◽  
A.N. Obraztsov ◽  
...  

1998 ◽  
Vol 536 ◽  
Author(s):  
E. Centurioni ◽  
A. Desalvo ◽  
R. Pinghini ◽  
R. Rizzoli ◽  
C. Summonte ◽  
...  

AbstractVery high frequency (100 MHz) hydrogen plasma treatments on a-Si:H deposited by plasma enhanced chemical vapour deposition were studied. Ex-situ optical measurements have shown that etching and chemical transport occur as competing phenomena. The one that prevails is determined by the plasma conditions. In particular, very efficient chemical etching is observed for high H2 flow rates, while, for low H2 flow rates, the equilibrium is shifted toward deposition, and a structural modification of the sample is observed. The experimental conditions were stressed in the direction of utilizing chemical transport from the cathode to deposit very thin (7 nm) microcrystalline films with a pure H2 plasma.


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