Structural analysis, elemental profiling, and electrical characterization of HfO2 thin films deposited on In0.53Ga0.47As surfaces by atomic layer deposition

2009 ◽  
Vol 106 (8) ◽  
pp. 084508 ◽  
Author(s):  
R. D. Long ◽  
É. O’Connor ◽  
S. B. Newcomb ◽  
S. Monaghan ◽  
K. Cherkaoui ◽  
...  
2019 ◽  
Vol 19 (2) ◽  
pp. 72-81 ◽  
Author(s):  
Xing Li ◽  
Hong-Liang Lu ◽  
Hong-Ping Ma ◽  
Jian-Guo Yang ◽  
Jin-Xin Chen ◽  
...  

2018 ◽  
Vol 29 (18) ◽  
pp. 15349-15357 ◽  
Author(s):  
Joel Molina-Reyes ◽  
Hugo Tiznado ◽  
Gerardo Soto ◽  
Monica Vargas-Bautista ◽  
David Dominguez ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (65) ◽  
pp. 60479-60486 ◽  
Author(s):  
Yang Hu ◽  
Amund Ruud ◽  
Ville Miikkulainen ◽  
Truls Norby ◽  
Ola Nilsen ◽  
...  

Comparison of in-plane and cross-plane conductivity on ALD-deposited LiAlO2 thin films.


2010 ◽  
Vol 157 (10) ◽  
pp. G193 ◽  
Author(s):  
Aile Tamm ◽  
Marianna Kemell ◽  
Jekaterina Kozlova ◽  
Timo Sajavaara ◽  
Massimo Tallarida ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document