Backscattering analysis of the composition of silicon‐nitride films deposited by rf reactive sputtering

1976 ◽  
Vol 47 (4) ◽  
pp. 1302-1309 ◽  
Author(s):  
C. J. Mogab ◽  
E. Lugujjo
2019 ◽  
Vol 39 (1) ◽  
pp. 315-320 ◽  
Author(s):  
Guilherme Sombrio ◽  
Antônio Eudócio P. De Mattos ◽  
Paulo L. Franzen ◽  
Marcelo B. Pereira ◽  
Henri I. Boudinov

1980 ◽  
Vol 19 (S1) ◽  
pp. 71
Author(s):  
Youichi Hoshi ◽  
Masahiko Naoe ◽  
Shun-ichi Yamanaka

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