Evidence of a thermally stimulated charge transfer mechanism and interface defect formation in metal-oxide-semiconductor structures with germanium nanocrystals

2009 ◽  
Vol 105 (6) ◽  
pp. 064513 ◽  
Author(s):  
Reinhard Beyer ◽  
Johannes von Borany
Keyword(s):  
Charge Transfer ◽  
Metal Oxide ◽  
Defect Formation ◽  
Metal Oxide Semiconductor ◽  
Transfer Mechanism ◽  
Oxide Semiconductor ◽  
Semiconductor Structures ◽  
Charge Transfer Mechanism ◽  
Interface Defect ◽  
Germanium Nanocrystals

Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer

2015 ◽  
Vol 106 (5) ◽  
pp. 051605 ◽  
Author(s):  
Shenghou Liu ◽  
Shu Yang ◽  
Zhikai Tang ◽  
Qimeng Jiang ◽  
Cheng Liu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Interfacial Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures

Trap states in AlGaN/GaN metal-oxide-semiconductor structures with Al2O3 prepared by atomic layer deposition

2010 ◽  
Vol 107 (10) ◽  
pp. 106104 ◽  
Author(s):  
D. Gregušová ◽  
R. Stoklas ◽  
Ch. Mizue ◽  
Y. Hori ◽  
J. Novák ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Metal Oxide ◽  
Atomic Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Trap States ◽  
Semiconductor Structures ◽  
Layer Deposition

Engineering metal oxide semiconductor nanostructures for enhanced charge transfer: fundamentals and emerging SERS applications

2022 ◽  
Author(s):  
Samriti ◽  
Vishal Rajput ◽  
Raju Kumar Gupta ◽  
Jai Prakash
Keyword(s):  
Charge Transfer ◽  
Metal Oxide ◽  
Semiconductor Nanostructures ◽  
Metal Oxide Semiconductor ◽  
Metal Oxide Semiconductors ◽  
Oxide Semiconductor ◽  
Oxide Semiconductors ◽  
Transfer Processes

Fundamentals of doping engineering strategies of metal oxide semiconductors and various charge transfer processes for emerging SERS applications are discussed.

scholarly journals Perovskite Metal–Oxide–Semiconductor Structures for Interface Characterization

2021 ◽  
pp. 2101004
Author(s):  
José M. V. Cunha ◽  
M. Alexandra Barreiros ◽  
Marco A. Curado ◽  
Tomás S. Lopes ◽  
Kevin Oliveira ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Interface Characterization ◽  
Semiconductor Structures
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