Tip size effects on atomic force microscopy nanoindentation of a gold single crystal

2008 ◽  
Vol 104 (11) ◽  
pp. 113515 ◽  
Author(s):  
Marcel Lucas ◽  
Ken Gall ◽  
Elisa Riedo
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Size Effects ◽  
Force Microscopy ◽  
Atomic Force

Surface observations of synthetic hydroxyapatite single crystal by atomic force microscopy

1995 ◽  
Vol 148 (1-2) ◽  
pp. 201-206 ◽  
Author(s):  
Kazuo Onuma ◽  
Atsuo Ito ◽  
Tetsuya Tateishi ◽  
Tetsuya Kameyama
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force ◽  
Synthetic Hydroxyapatite ◽  
Surface Observations

Atomic force microscopy of C60/C70 single-crystal fullerenes under ethanol

1993 ◽  
Vol 56 (3) ◽  
pp. 207-210 ◽  
Author(s):  
P. Dietz ◽  
P. Hansma ◽  
K. Fostiropoulos ◽  
W. Kr�tschmer
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force

Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

2009 ◽  
Vol 106 (5) ◽  
pp. 054301 ◽  
Author(s):  
E. Tranvouez ◽  
E. Boer-Duchemin ◽  
A. J. Mayne ◽  
T. Vanderbruggen ◽  
M. Scheele ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Diamond Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Crystal Diamond

Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

Size effects in bimetallic nickel–gold nanowires: Insight from atomic force microscopy nanoindentation

2014 ◽  
Vol 66 ◽  
pp. 32-43 ◽  
Author(s):  
E.L. Wood ◽  
T. Avant ◽  
G.S. Kim ◽  
S.K. Lee ◽  
Z. Burchman ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Size Effects ◽  
Gold Nanowires ◽  
Force Microscopy ◽  
Atomic Force
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