Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

Structural investigation of ionic liquid/rubrene single crystal interfaces by using frequency-modulation atomic force microscopy

2013 ◽  
Vol 49 (90) ◽  
pp. 10596 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Tomohiro Harada ◽  
Akihito Imanishi ◽  
Takafumi Uemura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Structural Investigation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystal Interfaces

Clean surface processing of rubrene single crystal immersed in ionic liquid by using frequency modulation atomic force microscopy

2014 ◽  
Vol 104 (26) ◽  
pp. 263102 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Clean Surface ◽  
Surface Processing ◽  
Force Microscopy ◽  
Atomic Force

Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB08 ◽  
Author(s):  
Takashi Ichii ◽  
Motohiko Fujimura ◽  
Masahiro Negami ◽  
Kuniaki Murase ◽  
Hiroyuki Sugimura
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Frequency Modulation ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals A non-volatile resistive memory effect in 2,2′,6,6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy

RSC Advances ◽  
2017 ◽  
Vol 7 (6) ◽  
pp. 3336-3342 ◽  
Author(s):  
Marc Courté ◽  
Sandeep G. Surya ◽  
Ramesh Thamankar ◽  
Chao Shen ◽  
V. Ramgopal Rao ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Memory Effect ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Field Effect Transistors ◽  
Resistive Memory ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Effect Transistor

A non-volatile resistive memory effect is observed in 2,2′,6,6′-tetraphenyldipyranylidene (DIPO-Ph4), a large planar quinoïd π-conjugated heterocycle, in a field-effect transistor (FET) configuration and by conductive atomic force microscopy (c-AFM).

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