Atomic force microscopy of C60/C70 single-crystal fullerenes under ethanol

1993 ◽  
Vol 56 (3) ◽  
pp. 207-210 ◽  
Author(s):  
P. Dietz ◽  
P. Hansma ◽  
K. Fostiropoulos ◽  
W. Kr�tschmer
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force

Surface observations of synthetic hydroxyapatite single crystal by atomic force microscopy

1995 ◽  
Vol 148 (1-2) ◽  
pp. 201-206 ◽  
Author(s):  
Kazuo Onuma ◽  
Atsuo Ito ◽  
Tetsuya Tateishi ◽  
Tetsuya Kameyama
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force ◽  
Synthetic Hydroxyapatite ◽  
Surface Observations

Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

2009 ◽  
Vol 106 (5) ◽  
pp. 054301 ◽  
Author(s):  
E. Tranvouez ◽  
E. Boer-Duchemin ◽  
A. J. Mayne ◽  
T. Vanderbruggen ◽  
M. Scheele ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Diamond Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Crystal Diamond

Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

XANES AND ATOMIC FORCE MICROSCOPY STUDIES ON PRE- AND POST-IRRADIATED SAPPHIRE

2008 ◽  
Vol 22 (30) ◽  
pp. 3007-3013 ◽  
Author(s):  
D. M. BHARDWAJ ◽  
D. C. JAIN ◽  
RAVI KUMAR ◽  
R. P. GUPTA ◽  
K. B. GARG
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
South African ◽  
Structural Changes ◽  
Force Microscopy ◽  
Atomic Force Microscopy Technique ◽  
Microscopy Technique ◽  
Atomic Force ◽  
Sapphire Single Crystal ◽  
Edge Features

XANES measurements at the Fe - K edge on natural South African sapphire single crystal (corundum) and an irradiated sample with fluence 1 × 1012 Ni 6+ ions/cm 2 are reported. Some decrease in intensity of pre-edge features (1s → 3d) and increase in intensity of 1s → 4p transition in Fe is observed with Ni fluence. Structural changes and modification on surface of irradiated sapphire with Ni 6+ ion have been observed by the atomic force microscopy technique and discussed in the term of defects.

Application of different atomic force microscopy methods for detailed diagnostics of gold nanocoatings on a single-crystal sapphire surface

2011 ◽  
Vol 56 (3) ◽  
pp. 508-516 ◽  
Author(s):  
A. E. Muslimov ◽  
Yu. O. Volkov ◽  
V. E. Asadchikov ◽  
V. M. Kanevskii ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Sapphire Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Crystal Sapphire
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