Analysis of the recombination velocity and of the electron beam induced current contrast at the interface between a metallic precipitate and a semiconductor matrix

2008 ◽  
Vol 103 (11) ◽  
pp. 113718 ◽  
Author(s):  
M. Debez ◽  
R.-J. Tarento ◽  
D. E. Mekki
Keyword(s):  
Electron Beam ◽  
Induced Current ◽  
Semiconductor Matrix ◽  
Electron Beam Induced Current ◽  
Recombination Velocity

Temperature-dependent recombination velocity analysis on artificial small angle grain boundaries using electron beam induced current method

2016 ◽  
Vol 119 (6) ◽  
pp. 065302 ◽  
Author(s):  
Takuto Kojima ◽  
Tomihisa Tachibana ◽  
Yoshio Ohshita ◽  
Ronit R. Prakash ◽  
Takashi Sekiguchi ◽  
...  
Keyword(s):  
Electron Beam ◽  
Grain Boundaries ◽  
Small Angle ◽  
Current Method ◽  
Velocity Analysis ◽  
Induced Current ◽  
Temperature Dependent ◽  
Electron Beam Induced Current ◽  
Recombination Velocity
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