Atomic scale characterization of buried InxGa1−xAs quantum dots using pulsed laser atom probe tomography

2008 ◽  
Vol 92 (23) ◽  
pp. 233115 ◽  
Author(s):  
M. Müller ◽  
A. Cerezo ◽  
G. D. W. Smith ◽  
L. Chang ◽  
S. S. A. Gerstl
Keyword(s):  
Quantum Dots ◽  
Atom Probe Tomography ◽  
Pulsed Laser ◽  
Atom Probe ◽  
Atomic Scale ◽  
Scale Characterization

Atomic-scale characterization of germanium isotopic multilayers by atom probe tomography

2013 ◽  
Vol 113 (2) ◽  
pp. 026101 ◽  
Author(s):  
Y. Shimizu ◽  
H. Takamizawa ◽  
Y. Kawamura ◽  
M. Uematsu ◽  
T. Toyama ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Scale Characterization

scholarly journals Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography

2019 ◽  
Vol 123 (12) ◽  
pp. 7381-7389 ◽  
Author(s):  
Rémi Demoulin ◽  
Manuel Roussel ◽  
Sébastien Duguay ◽  
Dominique Muller ◽  
Daniel Mathiot ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Si Nanocrystals ◽  
Scale Characterization

scholarly journals Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

2008 ◽  
Vol 16 (4) ◽  
pp. 42-47 ◽  
Author(s):  
Brian P. Gorman ◽  
David Diercks ◽  
Norman Salmon ◽  
Eric Stach ◽  
Gonzalo Amador ◽  
...  
Keyword(s):  
A Priori ◽  
Atom Probe ◽  
Atomic Scale ◽  
Original Position ◽  
3 Dimensional ◽  
Original Specimen ◽  
High Electrical Field ◽  
Scale Characterization ◽  
Surface Monolayers

Atom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.

Atomic-scale compositional characterization of a nanocrystalline AlCrCuFeNiZn high-entropy alloy using atom probe tomography

2013 ◽  
Vol 61 (12) ◽  
pp. 4696-4706 ◽  
Author(s):  
K.G. Pradeep ◽  
N. Wanderka ◽  
P. Choi ◽  
J. Banhart ◽  
B.S. Murty ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
High Entropy Alloy ◽  
High Entropy ◽  
Compositional Characterization

scholarly journals Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques

2006 ◽  
Vol 12 (S02) ◽  
pp. 534-535 ◽  
Author(s):  
M Watanabe ◽  
D Saxey ◽  
R Zheng ◽  
D Williams ◽  
S Ringer
Keyword(s):  
Electron Microscopy ◽  
Atom Probe Tomography ◽  
Spherical Aberration ◽  
Analytical Electron Microscopy ◽  
Atom Probe ◽  
Atomic Scale ◽  
Analytical Electron ◽  
Microscopy Techniques ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

scholarly journals Atomic scale characterization of Mn doped InAs/GaAs quantum dots

2010 ◽  
Vol 96 (4) ◽  
pp. 042108 ◽  
Author(s):  
M. Bozkurt ◽  
V. A. Grant ◽  
J. M. Ulloa ◽  
R. P. Campion ◽  
C. T. Foxon ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Atomic Scale ◽  
Scale Characterization ◽  
Mn Doped
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