Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography
2019 ◽
Vol 123
(12)
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pp. 7381-7389
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2013 ◽
Vol 61
(12)
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pp. 4696-4706
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2006 ◽
Vol 12
(S02)
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pp. 534-535
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2019 ◽
Vol 116
(8)
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pp. 2866-2874
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