Highly sensitive detection of near-field Raman scattered light from strained Si∕SiGe heterostructures by scanning near-field optical Raman microscope using ultraviolet resonant Raman scattering
2015 ◽
Vol 17
(11)
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pp. 114019
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2013 ◽
Vol 58
(3)
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pp. 753-756
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Keyword(s):
2016 ◽
Vol 8
(17)
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pp. 10665-10672
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Keyword(s):
2010 ◽
Vol 397
(4)
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pp. 1595-1604
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