Characterization of Si nanostructures using a noncontact mode scanning near-field optical Raman microscope, with 100nm spatial resolution and 5nm depth resolution, using ultraviolet resonant Raman scattering
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2006 ◽
Vol 45
(No. 19)
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pp. L486-L489
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2019 ◽
Vol 377
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pp. 124891
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2001 ◽
Vol 350
(5-6)
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pp. 373-380
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2008 ◽
Vol 255
(3)
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pp. 725-727
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1987 ◽
Vol 48
(C5)
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pp. C5-345-C5-348
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