Near-Field Optical Microscopy of AlGaInP Laser Diode Emissions and Comparison with Far-Field Observation: Possible Non-Radiating Modes

2007 ◽  
Author(s):  
Akihiro Tomioka ◽  
Yasuaki Itakura ◽  
Shinji Kinoshita ◽  
Yuya Kurokawa ◽  
Yukiya Tanimura ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Laser Diode ◽  
Field Observation ◽  
Near Field ◽  
Far Field

Near-field optical microscopy of AlGaInP laser diode emissions and comparison with far-field observation

2008 ◽  
Vol 313-314 ◽  
pp. 474-478 ◽  
Author(s):  
Akihiro Tomioka ◽  
Atsushi Fujimoto ◽  
Shinji Kinoshita ◽  
Takaaki Miura ◽  
Akira Sakashita ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Laser Diode ◽  
Field Observation ◽  
Near Field ◽  
Far Field

Comparison of Near-Field Emission Profiles and Emission Spectra of AlGaAs Laser Diode with Far-Field TE- and TM-mode Optical Microscopy

2007 ◽  
Author(s):  
Atsushi Fujimoto ◽  
Akihiro Tomioka ◽  
Shinji Kinoshita ◽  
Takafumi Kai ◽  
Hiroyuki Kobo ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Field Emission ◽  
Laser Diode ◽  
Near Field ◽  
Emission Spectra ◽  
Far Field ◽  
Tm Mode

Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy

2000 ◽  
Author(s):  
Noel Axelrod ◽  
Anna Radko ◽  
Nissim Ben-Yosef ◽  
Artium Khatchatouriants ◽  
Millet Treinin ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Far Field ◽  
Atomic Force

scholarly journals k-space imaging of the eigenmodes of sharp gold tapers for scanning near-field optical microscopy

2013 ◽  
Vol 4 ◽  
pp. 603-610 ◽  
Author(s):  
Martin Esmann ◽  
Simon F Becker ◽  
Bernard B da Cunha ◽  
Jens H Brauer ◽  
Ralf Vogelgesang ◽  
...  
Keyword(s):  
Spatial Frequency ◽  
Optical Microscopy ◽  
Frequency Domain ◽  
Near Field ◽  
Higher Order ◽  
Far Field ◽  
Radiation Patterns ◽  
Background Ratio ◽  
Higher Order Modes ◽  
Spatial Frequency Domain

We investigate the radiation patterns of sharp conical gold tapers, which were designed as adiabatic nanofocusing probes for scanning near-field optical microscopy (SNOM). Field calculations show that only the lowest order eigenmode of such a taper can reach the very apex and thus induce the generation of strongly enhanced near-field signals. Higher-order modes are coupled into the far field at finite distances from the apex. Here, we demonstrate experimentally how to distinguish and separate between the lowest and higher-order eigenmodes of such a metallic taper by filtering in the spatial frequency domain. Our approach has the potential to considerably improve the signal-to-background ratio in spectroscopic experiments at the nanoscale.

Far-field background suppression in tip-modulated apertureless near-field optical microscopy

2006 ◽  
Vol 99 (12) ◽  
pp. 124309 ◽  
Author(s):  
Pietro Giuseppe Gucciardi ◽  
Guillaume Bachelier ◽  
Maria Allegrini
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Background Suppression ◽  
Far Field
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