An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation

R. Bachelot; G. Wurtz; P. Royer

doi:10.1063/1.122760

An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation

Applied Physics Letters ◽

10.1063/1.122760 ◽

1998 ◽

Vol 73 (23) ◽

pp. 3333-3335 ◽

Cited By ~ 10

Author(s):

R. Bachelot ◽

G. Wurtz ◽

P. Royer

Keyword(s):

Optical Microscopy ◽

Laser Diode ◽

Near Field ◽

Microscopy Imaging ◽

Optical Microscopy Imaging

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Erratum: “An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation” [Appl. Phys. Lett.73, 3333 (1998)]

Applied Physics Letters ◽

10.1063/1.123547 ◽

1999 ◽

Vol 74 (9) ◽

pp. 1347-1347

Author(s):

R. Bachelot ◽

G. Wurtz ◽

P. Royer

Keyword(s):

Optical Microscopy ◽

Laser Diode ◽

Near Field ◽

Microscopy Imaging ◽

Optical Microscopy Imaging

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Near Field Optical Microscopy Imaging with a Free Electron Laser in the 1–10 Micron Spectral Range: Overview and Perspectives

Nanoscience and Nanotechnology Letters ◽

10.1166/nnl.2011.1242 ◽

2011 ◽

Vol 3 (6) ◽

pp. 913-921 ◽

Cited By ~ 2

Author(s):

Antonio Cricenti ◽

Marco Luce ◽

Norman H. Tolk ◽

Giorgio Margaritondo

Keyword(s):

Optical Microscopy ◽

Spectral Range ◽

Free Electron ◽

Free Electron Laser ◽

Near Field ◽

Microscopy Imaging ◽

Optical Microscopy Imaging

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Noncontact Near-Field Scanning Optical Microscopy Imaging Using an Interferometric Optical Feedback Mechanism

Langmuir ◽

10.1021/la981198s ◽

1999 ◽

Vol 15 (6) ◽

pp. 2162-2168 ◽

Cited By ~ 4

Author(s):

Hitoshi Shiku ◽

Jeffrey R. Krogmeier ◽

Robert C. Dunn

Keyword(s):

Optical Microscopy ◽

Optical Feedback ◽

Near Field ◽

Feedback Mechanism ◽

Microscopy Imaging ◽

Optical Microscopy Imaging ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Image contrast of dielectric specimens in transmission mode near-field scanning optical microscopy: imaging properties and tip artefacts

Journal of Microscopy ◽

10.1111/j.1365-2818.1995.tb03611.x ◽

1995 ◽

Vol 179 (1) ◽

pp. 29-54 ◽

Cited By ~ 29

Author(s):

G. A. VALASKOVIC ◽

M. HOLTON ◽

G. H. MORRISON

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Image Contrast ◽

Transmission Mode ◽

Microscopy Imaging ◽

Optical Microscopy Imaging ◽

Scanning Optical Microscopy ◽

Imaging Properties ◽

Near Field Scanning

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Novel approaches for scanning near-field optical microscopy imaging of oligodendrocytes in culture

NeuroImage ◽

10.1016/j.neuroimage.2009.07.035 ◽

2010 ◽

Vol 49 (1) ◽

pp. 517-524 ◽

Cited By ~ 7

Author(s):

E. Trevisan ◽

E. Fabbretti ◽

N. Medic ◽

B. Troian ◽

S. Prato ◽

...

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Microscopy Imaging ◽

Novel Approaches ◽

Optical Microscopy Imaging

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Near-field scanning optical microscopy imaging of multimode interference

Optics Letters ◽

10.1364/ol.28.001111 ◽

2003 ◽

Vol 28 (13) ◽

pp. 1111 ◽

Cited By ~ 1

Author(s):

A. L. Campillo ◽

J. W. P. Hsu

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Multimode Interference ◽

Microscopy Imaging ◽

Optical Microscopy Imaging ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Visibility of subsurface nanostructures in scattering-type scanning near-field optical microscopy imaging

Optics Express ◽

10.1364/oe.386713 ◽

2020 ◽

Vol 28 (5) ◽

pp. 6696 ◽

Cited By ~ 2

Author(s):

Wenhao Zhang ◽

Yuhang Chen

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Microscopy Imaging ◽

Optical Microscopy Imaging

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Near-field scanning optical microscopy imaging: theory, simulation, and experiment

10.1117/12.351044 ◽

1999 ◽

Author(s):

Garnett W. Bryant ◽

Ansheng Liu

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Microscopy Imaging ◽

Simulation And Experiment ◽

Imaging Theory ◽

Optical Microscopy Imaging ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Near‐field scanning optical microscopy imaging of individual threading dislocations on relaxed GexSi1−xfilms

Applied Physics Letters ◽

10.1063/1.112366 ◽

1994 ◽

Vol 65 (3) ◽

pp. 344-346 ◽

Cited By ~ 36

Author(s):

J. W. P. Hsu ◽

E. A. Fitzgerald ◽

Y. H. Xie ◽

P. J. Silverman

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Threading Dislocations ◽

Microscopy Imaging ◽

Optical Microscopy Imaging ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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An optical microscopy imaging method for detection of electromigration-induced damage

Microelectronic Engineering ◽

10.1016/j.mee.2004.06.001 ◽

2004 ◽

Vol 75 (3) ◽

pp. 252-256 ◽

Cited By ~ 2

Author(s):

L.H. Li ◽

C. Piecuch ◽

J. Hiatt ◽

B. Setlik ◽

D. Heskett

Keyword(s):

Optical Microscopy ◽

Imaging Method ◽

Microscopy Imaging ◽

Optical Microscopy Imaging

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