Far-field background suppression in tip-modulated apertureless near-field optical microscopy

2006 ◽  
Vol 99 (12) ◽  
pp. 124309 ◽  
Author(s):  
Pietro Giuseppe Gucciardi ◽  
Guillaume Bachelier ◽  
Maria Allegrini
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Background Suppression ◽  
Far Field

Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy

2000 ◽  
Author(s):  
Noel Axelrod ◽  
Anna Radko ◽  
Nissim Ben-Yosef ◽  
Artium Khatchatouriants ◽  
Millet Treinin ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Far Field ◽  
Atomic Force

scholarly journals k-space imaging of the eigenmodes of sharp gold tapers for scanning near-field optical microscopy

2013 ◽  
Vol 4 ◽  
pp. 603-610 ◽  
Author(s):  
Martin Esmann ◽  
Simon F Becker ◽  
Bernard B da Cunha ◽  
Jens H Brauer ◽  
Ralf Vogelgesang ◽  
...  
Keyword(s):  
Spatial Frequency ◽  
Optical Microscopy ◽  
Frequency Domain ◽  
Near Field ◽  
Higher Order ◽  
Far Field ◽  
Radiation Patterns ◽  
Background Ratio ◽  
Higher Order Modes ◽  
Spatial Frequency Domain

We investigate the radiation patterns of sharp conical gold tapers, which were designed as adiabatic nanofocusing probes for scanning near-field optical microscopy (SNOM). Field calculations show that only the lowest order eigenmode of such a taper can reach the very apex and thus induce the generation of strongly enhanced near-field signals. Higher-order modes are coupled into the far field at finite distances from the apex. Here, we demonstrate experimentally how to distinguish and separate between the lowest and higher-order eigenmodes of such a metallic taper by filtering in the spatial frequency domain. Our approach has the potential to considerably improve the signal-to-background ratio in spectroscopic experiments at the nanoscale.

scholarly journals Near-Field IR Orientational Spectroscopy of Silk

2019 ◽  
Author(s):  
Meguya Ryu ◽  
Reo Honda ◽  
Aina Reich ◽  
Adrian Cernescu ◽  
Jing-Liang Li ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Cross Sections ◽  
Molecular Orientation ◽  
Near Field ◽  
Beta Sheets ◽  
Far Field ◽  
Absorbance Measurement

Orientational dependence of the IR absorbing amide bands of silk is demonstrated from two orthogonal longitudinal and transverse microtome slices only $\sim 100$~nm thick. A scanning near-field optical microscopy (SNOM) which preferentially probes orientation perpendicular to the sample's surface was used. Spatial resolution of silk-epoxy boundary was defined with a $\sim 100$~nm resolution while the spectra were collected by a $\sim 10$~nm tip. Ratio of the absorbance of the amide-II C-N at 1512~cm$^{-1}$ and amide-I C=O $\beta$-sheets at 1628~cm$^{-1}$ showed sensitivity of SNOM to the molecular orientation. SNOM characterisation is complimentary to the far-field absorbance which is sensitive to the in-plane polarisation. Volumes with cross sections smaller than 100~nm can be characterised for molecular orientation. A method of absorbance measurements at four angles of slice cut orientation, which is equivalent to the four polarisation angles absorbance measurement is proposed.

Progress in near-field scanning optical microscopy (NSOM)

1988 ◽  
Vol 46 ◽  
pp. 436-437
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
K. Lin ◽  
A. Lewis
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Visible Region ◽  
Optical Microscope ◽  
Scanning Tunneling ◽  
Far Field ◽  
Tunneling Microscopy ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Scanning Electron

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

scholarly journals Attaboy! Attoboys, or the new Zeptoscopists

1993 ◽  
Vol 1 (8) ◽  
pp. 2-3 ◽  
Author(s):  
Jean-Paul Revel
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Far Field ◽  
Force Microscopy ◽  
Near Field Optics ◽  
Scanning Force ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

As the year ends there is a bumper crop of announcements of advances that I find absolutely amazing. First of course is the continued clever use of light as a veritable tool in manipulating everything from atoms (entrapping them in “atomic molasses”) to having tugs of war with biological motors (using “light tweezers”). But these developments will be for discussion another time. What I want to talk about in this installment are advances in Near Field Scanning Optical Microscopy (NSOM), which has now been used by Chichester and Betzig to visualize single molecules.In classical (far field) optics, resolution is limited by diffraction to about 1/2 the wavelength of the radiation used for imaging. Near field optics overcome this limitation by use of scanning techniques similar to those employed in Scanning Tunneling or Scanning Force Microscopy.

Near-Field Optical Microscopy of AlGaInP Laser Diode Emissions and Comparison with Far-Field Observation: Possible Non-Radiating Modes

2007 ◽  
Author(s):  
Akihiro Tomioka ◽  
Yasuaki Itakura ◽  
Shinji Kinoshita ◽  
Yuya Kurokawa ◽  
Yukiya Tanimura ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Laser Diode ◽  
Field Observation ◽  
Near Field ◽  
Far Field
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