White Beam Slits and Pink Beam Slits for the Hard X-ray Nanoprobe Beamline at the Advanced Photon Source

2007 ◽  
Author(s):  
C. Benson ◽  
Y. Jaski ◽  
J. Maser ◽  
T. Powers ◽  
O. Schmidt ◽  
...  
Keyword(s):  
X Ray ◽  
White Beam ◽  
Photon Source

Strain and Texture in Al-Interconnect Wires Weasured by X-Xay Microbeam Diffraction

1999 ◽  
Vol 563 ◽  
Author(s):  
Nobumichi Tamura ◽  
J.-S. Chung ◽  
G. E. Ice ◽  
B. C. Larson ◽  
J. D. Budai ◽  
...  
Keyword(s):  
Local Strain ◽  
Beam Line ◽  
Strain Measurements ◽  
X Ray ◽  
Intergranular Strain ◽  
White Beam ◽  
Individual Grains ◽  
Photon Source

AbstractThe local strain and texture in Al interconnect wires have been investigated using white and monochromatic x-ray microbeams on the MHATTCAT undulator beam line at the Advanced Photon Source. Intergrain and intragrain orientations were obtained with ∼0.01° sensitivity using white beam measurements on wide Al pads (∼100 μm) and thin (2 μm) Al wires. Orientation changes of up to 1°were found within individual grains of the (111) textured Al interconnects. Deviatoric strain measurements indicate small intragranular strain variations, but intergranular strain variations were found to be quite large.

scholarly journals A fast white-beam shutter for hard x-ray topography at beamline 1-BM of the Advanced Photon Source

2014 ◽  
Vol 493 ◽  
pp. 012007 ◽  
Author(s):  
Naresh Kujala ◽  
Mark Erdmann ◽  
Kurt Goetze ◽  
Joseph Sullivan ◽  
Xianrong Huang ◽  
...  
Keyword(s):  
X Ray ◽  
White Beam ◽  
Photon Source

scholarly journals Precision white‐beam slit design for high power‐density x‐ray undulator beamlines at the Advanced Photon Source

1995 ◽  
Vol 66 (2) ◽  
pp. 1789-1791 ◽  
Author(s):  
D. Shu ◽  
C. Brite ◽  
T. Nian ◽  
W. Yun ◽  
D. R. Haeffner ◽  
...  
Keyword(s):  
Power Density ◽  
High Power ◽  
High Power Density ◽  
X Ray ◽  
White Beam ◽  
Photon Source

Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates

2015 ◽  
Vol 4 (8) ◽  
pp. P324-P330 ◽  
Author(s):  
L. Kirste ◽  
A. N. Danilewsky ◽  
T. Sochacki ◽  
K. Köhler ◽  
M. Zajac ◽  
...  
Keyword(s):  
Defect Structure ◽  
X Ray ◽  
White Beam ◽  
Topography Analysis

Design and characterization of an undulator beamline optimized for small-angle coherent X-ray scattering at the Advanced Photon Source

1999 ◽  
Vol 6 (6) ◽  
pp. 1174-1184 ◽  
Author(s):  
A. R. Sandy ◽  
L. B. Lurio ◽  
S. G. J. Mochrie ◽  
A. Malik ◽  
G. B. Stephenson ◽  
...  
Keyword(s):  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

scholarly journals Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source

2018 ◽  
Vol 24 (S2) ◽  
pp. 200-201 ◽  
Author(s):  
Bi-Hsuan Lin ◽  
Shao-Chin Tseng ◽  
Xiao-Yun Li ◽  
Dai-Jie Lin ◽  
Hsu-Cheng Hsu ◽  
...  
Keyword(s):  
X Ray ◽  
Photon Source

Synchrotron white beam x-ray topography (SWBXT) and high resolution triple axis diffraction studies on AlN layers grown on 4H- and 6H-SiC seeds

2004 ◽  
Vol 831 ◽  
Author(s):  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
Rafael Dalmau ◽  
Raoul Schlesser ◽  
Zlatko Sitar
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Large Diameter ◽  
Laser Diodes ◽  
Growth Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
White Beam ◽  
Strain Data ◽  
Growth Experiments

ABSTRACTFor nitride based devices such as LEDs, high power FETs and laser diodes, single crystal substrates of AlN are highly desirable. While the sublimation technique is suitable for growing bulk AlN crystals, appropriate seeds are also necessary for growing large diameter oriented boules. 4H- and 6H-SiC substrates which are readily available commercially can potentially be implemented as seeds for bulk AlN growth. However, issues regarding SiC decomposition at high temperatures, thermal expansion mismatch, single crystal growth, etc. need to be addressed. Towards this end, a series of growth experiments have been carried out in a resistively heated reactor using on and off-axis 4H- and 6H-SiC substrates as seeds for AlN growth from the vapor phase. Several hundred microns thick AlN layers have been grown under different growth conditions. Synchrotron white beam x-ray topography (SWBXT) has been used to map the defect distribution in the grown layers and high resolution triple axis x-ray diffraction (HRTXD) experiments were carried out to record reciprocal space maps from which tilt, mismatch and strain data can be obtained. These results are analyzed with respect to the growth conditions in order to gain a better understanding of this growth process.

Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals

1996 ◽  
Author(s):  
Hua Chung ◽  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
David J. Larson, Jr.
Keyword(s):  
Structural Defects ◽  
X Ray ◽  
White Beam
Sign in / Sign up

Export Citation Format

Share Document