A method for calculating capacitances and electrostatic forces in atomic force microscopy

2007 ◽  
Vol 101 (2) ◽  
pp. 024310 ◽  
Author(s):  
G. M. Sacha ◽  
E. Sahagún ◽  
J. J. Sáenz
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces

2014 ◽  
Vol 112 (16) ◽  
Author(s):  
Maximilian Schneiderbauer ◽  
Matthias Emmrich ◽  
Alfred J. Weymouth ◽  
Franz J. Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Short Range ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals How high is a MoSe2 monolayer?

2021 ◽  
Author(s):  
Megan Cowie ◽  
Rikke Plougmann ◽  
Yacine Benkirane ◽  
Léonard Schué ◽  
Zeno Schumacher ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Transition Metal ◽  
Transition Metal Dichalcogenides ◽  
Optical Methods ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Metal Dichalcogenides ◽  
Significant Attention

Abstract Transition metal dichalcogenides (TMDCs) have attracted significant attention for optoelectronic, photovoltaic and photoelectrochemical applications. The properties of TMDCs are highly dependent on the number of stacked atomic layers, which is usually counted post-fabrication, using a combination of optical methods and atomic force microscopy height measurements. Here, we use photoluminescence spectroscopy, Raman spectroscopy, and three different AFM methods to demonstrate significant discrepancies in height measurements of exfoliated MoSe2 flakes on SiO2 depending on the method used. We also highlight the often overlooked effect that electrostatic forces can be misleading when measuring the height of a MoSe2 flake using AFM.

Lifting and Sorting of Charged Au Nanoparticles by Electrostatic Forces in Atomic Force Microscopy

Small ◽  
2010 ◽  
Vol 6 (19) ◽  
pp. 2105-2108 ◽  
Author(s):  
JiaPeng Xu ◽  
Kwang Joo Kwak ◽  
James L. Lee ◽  
Gunjan Agarwal
Keyword(s):  
Atomic Force Microscopy ◽  
Au Nanoparticles ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy

2017 ◽  
Vol 28 (6) ◽  
pp. 065704 ◽  
Author(s):  
Nina Balke ◽  
Stephen Jesse ◽  
Ben Carmichael ◽  
M Baris Okatan ◽  
Ivan I Kravchenko ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Probe
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