Influence of electrostatic forces on the investigation of dopant atoms in layered semiconductors by scanning tunneling microscopy/spectroscopy and atomic force microscopy
1997 ◽
Vol 15
(3)
◽
pp. 1466-1472
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1994 ◽
pp. 229-236
1993 ◽
Vol 32
(Part 1, No. 12B)
◽
pp. 6200-9202
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1997 ◽
Vol 12
(8)
◽
pp. 1942-1945
◽
2019 ◽
Vol 40
(2)
◽
pp. 025004
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