scholarly journals Magnetic reconfiguration of MnAs∕GaAs(001) observed by magnetic force microscopy and resonant soft x-ray scattering

2006 ◽  
Vol 100 (8) ◽  
pp. 083906 ◽  
Author(s):  
L. N. Coelho ◽  
B. R. A. Neves ◽  
R. Magalhães-Paniago ◽  
F. C. Vicentin ◽  
H. Westfahl ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Magnetic force microscopy and x-ray scattering study of 70×550 nm2 pseudo-spin-valve nanomagnets

2003 ◽  
Vol 93 (10) ◽  
pp. 7927-7929 ◽  
Author(s):  
F. J. Castaño ◽  
Y. Hao ◽  
S. Haratani ◽  
C. A. Ross ◽  
B. Vögeli ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Spin Valve ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang
Keyword(s):  
Thermal Annealing ◽  
Bragg Reflection ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Au Thin Films ◽  
Ray Scattering

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

1999 ◽  
Vol 38 (4) ◽  
pp. 684 ◽  
Author(s):  
Victor E. Asadchikov ◽  
Angela Duparré ◽  
Stefan Jakobs ◽  
Albert Yu. Karabekov ◽  
Igor V. Kozhevnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Surfaces ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering

2006 ◽  
Author(s):  
M. L. Zanaveskin ◽  
Yu. V. Grishchenko ◽  
A. L. Tolstikhina ◽  
V. E. Asadchikov ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Light Scattering ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Microstructure Determination of AOT + Phenol Organogels Utilizing Small-Angle X-ray Scattering and Atomic Force Microscopy

2001 ◽  
Vol 123 (10) ◽  
pp. 2414-2421 ◽  
Author(s):  
Blake A. Simmons ◽  
Chad E. Taylor ◽  
Forrest A. Landis ◽  
Vijay T. John ◽  
Gary L. McPherson ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Small Angle ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering
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