scholarly journals Magnetic force microscopy and x-ray scattering study of 70×550 nm2 pseudo-spin-valve nanomagnets

2003 ◽  
Vol 93 (10) ◽  
pp. 7927-7929 ◽  
Author(s):  
F. J. Castaño ◽  
Y. Hao ◽  
S. Haratani ◽  
C. A. Ross ◽  
B. Vögeli ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Spin Valve ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

scholarly journals Magnetic reconfiguration of MnAs∕GaAs(001) observed by magnetic force microscopy and resonant soft x-ray scattering

2006 ◽  
Vol 100 (8) ◽  
pp. 083906 ◽  
Author(s):  
L. N. Coelho ◽  
B. R. A. Neves ◽  
R. Magalhães-Paniago ◽  
F. C. Vicentin ◽  
H. Westfahl ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Ray Scattering

Synchrotron x-ray scattering study of SnO2 thin film grown on sapphire

2002 ◽  
Vol 17 (9) ◽  
pp. 2417-2422 ◽  
Author(s):  
Gi-Hong Rue ◽  
Dae Hwang Yoo ◽  
Yoon Hwae Hwang ◽  
Hyung-Kook Kimb
Keyword(s):  
Lattice Mismatch ◽  
Sno2 Thin Film ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Scattering Study ◽  
The Difference ◽  
Variant Structure ◽  
Ray Scattering

From synchrotron x-ray scattering measurements, it was found that epitaxially grown SnO2 film on sapphire has a variant structure with threefold symmetry with respect to the substrate and that the ultrathin interfacial layer is formed due to the lattice mismatch between SnO2 and Al2O3. The physical properties of the top surface, such as surface morphology, height profile, and roughness, were determined by atomic force microscopy. The height profiles of the film grown at 600 °C and room temperature revealed the asymmetrical and the ordinary symmetric Gaussian distributions, respectively. The difference originates from the dominant diffusion process at high substrate temperature.

An X-ray Scattering Study of Laterally Modulated Structures: Investigation of Coherence and Resolution Effects with a Grating

1996 ◽  
Vol 6 (8) ◽  
pp. 1085-1094 ◽  
Author(s):  
A. Gibaud ◽  
J. Wang ◽  
M. Tolan ◽  
G. Vignaud ◽  
S. K. Sinha
Keyword(s):  
X Ray ◽  
X Ray Scattering ◽  
Modulated Structures ◽  
Scattering Study ◽  
Ray Scattering

Evolution of Pore Ordering during Anodizing of Aluminum Single Crystals: In Situ Small-Angle X-ray Scattering Study

2021 ◽  
Author(s):  
Ilya V. Roslyakov ◽  
Andrei P. Chumakov ◽  
Andrei A. Eliseev ◽  
Alexey P. Leontiev ◽  
Oleg V. Konovalov ◽  
...  
Keyword(s):  
Single Crystals ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

scholarly journals Model-Independent X-Ray Scattering Study of a Silica Sol Surface

JETP Letters ◽  
2018 ◽  
Vol 107 (6) ◽  
pp. 384-389 ◽  
Author(s):  
A. M. Tikhonov ◽  
V. E. Asadchikov ◽  
Yu. O. Volkov ◽  
B. S. Roshchin ◽  
V. Honkimäki ◽  
...  
Keyword(s):  
Silica Sol ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Model Independent ◽  
Ray Scattering
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