Improved breakdown voltage and impact ionization in InAlAs∕InGaAs metamorphic high-electron-mobility transistor with a liquid phase oxidized InGaAs gate

2005 ◽  
Vol 87 (26) ◽  
pp. 263501 ◽  
Author(s):  
Kuan-Wei Lee ◽  
Nan-Ying Yang ◽  
Mau-Phon Houng ◽  
Yeong-Her Wang ◽  
Po-Wen Sze
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