Improved breakdown voltage and impact ionization in InAlAs∕InGaAs metamorphic high-electron-mobility transistor with a liquid phase oxidized InGaAs gate
2007 ◽
Vol 46
(4B)
◽
pp. 2309-2311
◽
2012 ◽
Vol 59
(1)
◽
pp. 121-127
◽
2004 ◽
Vol 43
(4B)
◽
pp. 2239-2242
◽
2005 ◽
Vol 26
(12)
◽
pp. 864-866
◽
2015 ◽