Scanning tunneling microscopy characterization of low-profile crystalline TiSi2 microelectrodes on a Si(111) surface

2005 ◽  
Vol 86 (20) ◽  
pp. 203101 ◽  
Author(s):  
Xiao Tong ◽  
Robert A. Wolkow
ACS Nano ◽  
2013 ◽  
Vol 7 (10) ◽  
pp. 8529-8539 ◽  
Author(s):  
Quy Khac Ong ◽  
Javier Reguera ◽  
Paulo Jacob Silva ◽  
Mauro Moglianetti ◽  
Kellen Harkness ◽  
...  

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