Surface potential imaging of nanoscale LiNbO3 domains investigated by electrostatic force microscopy

2006 ◽  
Vol 89 (13) ◽  
pp. 132905 ◽  
Author(s):  
Xiaoyan Liu ◽  
Kenji Kitamura ◽  
Kazuya Terabe
Keyword(s):  
Surface Potential ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

Surface Potentials of Conjugated Molecules on Metal Surfaces: Measurements Using Electrostatic Force Microscopy and Calculations using a Preliminary Physically-Based Model.

2000 ◽  
Vol 636 ◽  
Author(s):  
S. Howell ◽  
D. Kuila ◽  
A. W. Ghosh ◽  
T. Rakshit ◽  
H. McNally ◽  
...  
Keyword(s):  
Surface Potential ◽  
Electrostatic Force ◽  
Self Assembled Monolayers ◽  
Electrostatic Force Microscopy ◽  
Conjugated Molecules ◽  
Physically Based Model ◽  
Force Microscopy ◽  
Physically Based ◽  
Aromatic Thiols ◽  
Assembled Monolayers

AbstractThe electrostatic surface potential of self-assembled monolayers (SAMs) of aliphatic and aromatic thiols has been measured using electrostatic force microscopy. The variation of the surface potential of chemisorbed alkanethiols, with respect to bare Au(111), is observed to increase with increasing chain length. The trend is similar to that observed in the literature. A preliminary theoretical model, based on treating the monolayer as a sheet of dipoles, has been used to calculate the surface potential of alkanethiols. Similar measurements on several aromatic thiols, with a symmetric and non-symmetric molecular structure, reveal that non-symmetric systems have significantly higher potential (≥ 170mV) than the symmetric molecules.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

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