Design of a multilayer mirror monochromatic x-ray imager for the Z accelerator

2004 ◽  
Vol 75 (10) ◽  
pp. 4029-4032 ◽  
Author(s):  
B. Jones ◽  
C. Deeney ◽  
A. Pirela ◽  
C. Meyer ◽  
D. Petmecky ◽  
...  
Keyword(s):  
X Ray ◽  
2020 ◽  
Author(s):  
Kiranjot ◽  
Mangalika Sinha ◽  
R. K. Gupta ◽  
P. K. Yadav ◽  
Mohammed H. Modi

2001 ◽  
Vol 72 (1) ◽  
pp. 1183-1187 ◽  
Author(s):  
S. Duorah ◽  
A. Ejiri ◽  
S. Lee ◽  
H. Iguchi ◽  
A. Fujisawa ◽  
...  

2021 ◽  
Vol 54 (6) ◽  
Author(s):  
Roman Pleshkov ◽  
Nikolay Chkhalo ◽  
Vladimir Polkovnikov ◽  
Mikhail Svechnikov ◽  
Maria Zorina

The structures of Cr/Be multilayer mirror interfaces are investigated using X-ray reflectometry, diffuse X-ray scattering and atomic force microscopy. The combination of these methods makes it possible to separate the contributions of roughness and interlayer diffusion/intermixing for each sample. In the range of period thicknesses of 2.26–0.8 nm, it is found that the growth roughness of the Cr/Be multilayer mirrors does not depend on the period thickness and is ∼0.2 nm. The separation of roughness and diffuseness allows estimation of layer material intermixing and the resulting drop in the optical contrast, which is from 0.85 to 0.17 in comparison with an ideally sharp structure.


2006 ◽  
Vol 77 (10) ◽  
pp. 10F330 ◽  
Author(s):  
D. Stutman ◽  
K. Tritz ◽  
L. Delgado-Aparicio ◽  
M. Finkenthal ◽  
G. Suliman ◽  
...  

2001 ◽  
Vol 206-213 ◽  
pp. 775-778 ◽  
Author(s):  
Gert Roebben ◽  
Chao Zhao ◽  
Ren-Guan Duan ◽  
Jef Vleugels ◽  
Marc M. Heyns ◽  
...  

1993 ◽  
Vol 32 (34) ◽  
pp. 6952 ◽  
Author(s):  
D. G. Stearns ◽  
R. S. Rosen ◽  
S. P. Vernon

2003 ◽  
Vol 104 ◽  
pp. 255-258 ◽  
Author(s):  
H. Takenaka ◽  
K. Nagai ◽  
H. Ito ◽  
S. Ichimaru ◽  
T. Ohchi ◽  
...  

Author(s):  
Hidekazu Mimura ◽  
Takashi Kimura ◽  
Hirokatsu Yumoto ◽  
Hikaru Yokoyama ◽  
Hiroki Nakamori ◽  
...  

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