A Two‐Crystal Spectrometer for X‐Rays of Wave‐Length 0.030<λ<0.215A

1935 ◽  
Vol 6 (11) ◽  
pp. 356-361 ◽  
Author(s):  
T. R. Cuykendall ◽  
M. T. Jones
Keyword(s):  
Wave Length ◽  
X Rays ◽  
Crystal Spectrometer

Crystal spectrometer for measurements of pionic X-rays

1985 ◽  
Vol 238 (2-3) ◽  
pp. 365-380 ◽  
Author(s):  
W. Beer ◽  
K. Bos ◽  
G. De Chambrier ◽  
K.L. Giovanetti ◽  
P.F.A. Goudsmit ◽  
...  
Keyword(s):  
X Rays ◽  
Crystal Spectrometer

scholarly journals The absorption of hard monochromatic γ-radiation

1930 ◽  
Vol 128 (807) ◽  
pp. 345-359 ◽  
Keyword(s):  
Absorption Coefficient ◽  
High Frequency ◽  
Wave Length ◽  
Low Frequency ◽  
Photoelectric Effect ◽  
Fourth Power ◽  
X Rays ◽  
Photoelectric Absorption ◽  
Initial Direction ◽  
Γ Radiation

Energy may be removed from a beam of γ -rays traversing matter by two distinct mechanisms. A quantum of radiation may be scattered by an electron out of its initial direction with change of wave-length, or it may be absorbed completely by an atom and produce a photoelectron. The total absorption coefficient, μ, is defined by the equation d I/ dx = -μI, and is the sum of the coefficients σ and τ referring respectively to the scattering and to the photoelectric effect. For radiation of low frequency, such as X-rays, the photoelectric absorption is very much more important than the absorption due to scattering, and many experiments have shown that the photoelectric absorption per atom varies as the fourth power of the atomic number and approximately as the cube of the wave-length. For radiation of high frequency, such as the more penetrating γ -rays, the photoelectric effect is, even for the heavy elements, smaller than the scattering absorption; and, since the scattering from each electron is always assumed to be independent of the atom from which it is derived, it is most convenient to divide μ. defined above by the number of electrons per unit volume in the material and to obtain μ e the absorption coefficient per electron.

scholarly journals Development of X-ray streak camera electronics at AWRE

1986 ◽  
Vol 4 (1) ◽  
pp. 145-156 ◽  
Author(s):  
M. C. Jackson ◽  
R. D. Long ◽  
D. Lee ◽  
N. J. Freeman
Keyword(s):  
Streak Camera ◽  
Sweep Rate ◽  
Bragg Diffraction ◽  
X Rays ◽  
Crystal Spectrometer ◽  
One Dimensional ◽  
X Ray ◽  
Ramp Generator ◽  
Laser Facility ◽  
User Facility

The paper reviews a number of X-ray streak cameras developed at AWRE. These cameras are used to provide temporal and one-dimensional spatial or spectral information on X-rays emitted from laser produced plasmas. Two of these cameras have been designed to be combined with other diagnostic instrumentation; one with a Wolter X-ray microscope (×22 magnification) and the other with a Bragg diffraction crystal spectrometer. This latter instrument provides a few eV spectral resolution and ∼15 ps temporal resolution; a typical experimental application at the AWRE HELEN laser facility will be described. The paper describes the circuitry of the bipolar avalanche transistor ramp generator used to drive the streak plates of the cameras. Improvements to this include: (a) increasing the fastest streak rate to ∼10 ps mm−1 by a distributed capacitance network across each of the bipolar stacks of transistors, and (b) reducing the trigger jitter to approximately ±10 ps by the use of a new mix of transistors in the stack and a Raytheon RS 3500 avalanche transistor. Additional improvements have now been added. These include a ‘half-scan’ user facility to aid initial camera timing and direct switching to select the sweep rate of the camera.

A double focusing crystal spectrometer for low energy X-rays

1992 ◽  
Vol 311 (1-2) ◽  
pp. 240-248 ◽  
Author(s):  
W. Beer ◽  
M. Bogdan ◽  
J.F. Gilot ◽  
P.F.A. Goudsmit ◽  
H.J. Leisi ◽  
...  
Keyword(s):  
Low Energy ◽  
X Rays ◽  
Crystal Spectrometer ◽  
Double Focusing
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