An Analysis of Scattered X-Rays with the Double Crystal Spectrometer

1930 ◽  
Vol 36 (6) ◽  
pp. 1050-1059 ◽  
Author(s):  
Newell S. Gingrich
1967 ◽  
Vol 11 ◽  
pp. 394-400
Author(s):  
Jun-ichi Chikawa ◽  
Stanley B. Austerman

AbstractA double.crystal arrangement was employed in the symmetrical Laue arrangement [(+n, −n) setting]. A perfect BeO crystal was used for the first crystal of the double-crystal spectrometer. To obtain a high X-ray intensity, the thickness of the crystal was made to correspond to a maximum of Pendellosung interference. A slit was pieced between the first and second (specimen) crystals to select the X-rays which precisely satisfy the Bragg condition. The slit was adjusted to avoid significant Fraunhofer diffraction. In this method, the incident beam for the specimen crystal was parallel enough to obtain intrinsic rocking curves of the specimen crystal. As an application, the method was used for determination of the senses of slight strains in BeO crystals.


1973 ◽  
Vol 28 (7) ◽  
pp. 1199-1204
Author(s):  
R. Bubáková ◽  
Z. Trousil

Deviations from Friedel's law in the case of anomalous transmission of X-rays have been estimated in as-grown silicon crystals. The results of measurements on a double crystal spectrometer agree with the dynamical theory of elastically deformed crystals. Using this theory, we have obtained information about growth deformation in crystals containing a small number of dislocations or in dislocation-free ones. Radii of curvature of crystal lattice planes of the order of km, orientation differences of the order of 0.1" and relative changes of lattice constants of the order of 10-3% have been estimated. Dislocation loops were observed at the boundary between the dislocation-free and the distorted part of the crystal.


1993 ◽  
Vol 03 (02) ◽  
pp. 177-183 ◽  
Author(s):  
J. Iihara ◽  
J. Kawai ◽  
T. Sekine ◽  
K. Yoshihara

Si K x-ray spectra in SiO 2- Na 2 O were measured with a double-crystal spectrometer. Remarkable change of peak energy, FWHM and intensity were found, depending on sodium contents. Theoretical spectra of Si K β x-ray were calculated to explain the change of x-ray intensity.


1996 ◽  
Vol 67 (9) ◽  
pp. 3348-3348
Author(s):  
D.M. Mills ◽  
W.K. Lee ◽  
M. Keeffe ◽  
D.R. Haeffner ◽  
P. Fernandez

Author(s):  
W. Beer ◽  
K. Bos ◽  
G. De Chambrier ◽  
K.L. Giovanetti ◽  
P.F.A. Goudsmit ◽  
...  
Keyword(s):  
X Rays ◽  

2007 ◽  
Vol 50 (4) ◽  
pp. 429-436 ◽  
Author(s):  
N. O. Elyutin ◽  
Yu. I. Smirnov ◽  
D. V. L’vov ◽  
A. N. Tyulyusov

1972 ◽  
Vol 22 (5) ◽  
pp. 427-428 ◽  
Author(s):  
J. Hrdý ◽  
E. Krouský
Keyword(s):  
X Rays ◽  

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