Magnetic easy-axis switching in Pt/Co/Pt sandwiches induced by nitrogen ion beam irradiation

2004 ◽  
Vol 95 (12) ◽  
pp. 8030-8034 ◽  
Author(s):  
T. Blon ◽  
G. Ben Assayag ◽  
D. Chassaing ◽  
D. Hrabovsky ◽  
J. F. Bobo ◽  
...  
Keyword(s):  
Easy Axis ◽  
Ion Beam ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Magnetic Easy Axis ◽  
Nitrogen Ion ◽  
Axis Switching

scholarly journals Ion beam irradiation mutagenesis in rye (Secale cereale L.), linseed (Linum usitatissimum L.) and faba bean (Vicia faba L.)

2018 ◽  
Vol 27 (3) ◽  
Author(s):  
Hamid Khazaei ◽  
Pirjo S.A. Mäkelä ◽  
Frederick L. Stoddard
Keyword(s):  
Faba Bean ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Growth Failure ◽  
Mutation Breeding ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Crop Species ◽  
Linum Usitatissimum L ◽  
Nitrogen Ion

Ion beam irradiation is a potential tool for inducing novel mutations in plants. We chose three crop species (rye, linseed, and faba bean) to determine the potential of nitrogen ion beam irradiation for inducing mutations. We tested ion beam irradiation with nitrogen ions at six different fluencies (5×105, 1×106, 5×106, 1×107, 5×107, and 1×108 N-ion cm-2) on dry grains. The three studied crop species had different sensitivities to the irradiation. Increased doses of ion irradiation had more effect on survival than on germination. Rye seedlings had the lowest survival rate at high doses of irradiation and significantly higher off-type plant phenotypes than the other two species. In M1 seedlings, stunted growth, failure to complete the plant life cycle and chlorophyll mutants were observed in all three species. Terminal-inflorescence mutations and sectional chimeras in faba bean were observed in the M2 generation. We conclude that ion beam irradiation is an effective tool for mutation breeding of diverse crop species when the appropriate dose is defined.

Surface modification of TiN films by nitrogen ion beam irradiation in ethylene gas atmosphere

Vacuum ◽  
2004 ◽  
Vol 74 (3-4) ◽  
pp. 659-663 ◽  
Author(s):  
Isao Nakamura ◽  
Daisuke Matsui ◽  
Michiko Sasaki ◽  
Ichiro Takano ◽  
Yoshio Sawada
Keyword(s):  
Surface Modification ◽  
Ion Beam ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Tin Films ◽  
Gas Atmosphere ◽  
Nitrogen Ion

Microfabrication on Teflon surface by MeV-proton-microbeam and keV-nitrogen-ion-beam irradiation

2013 ◽  
Vol 307 ◽  
pp. 610-613 ◽  
Author(s):  
Akane Kitamura (Ogawa) ◽  
Takahiro Satoh ◽  
Masashi Koka ◽  
Tomohiro Kobayashi ◽  
Tomihiro Kamiya
Keyword(s):  
Ion Beam ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Nitrogen Ion

scholarly journals Fabrication of Micropatterns on Teflon Surface by Proton Beam Writing and Nitrogen Ion Beam Irradiation

2013 ◽  
Vol 38 (1) ◽  
pp. 101-104 ◽  
Author(s):  
Akane Kitamura ◽  
Takahiro Satoh ◽  
Masashi Koka ◽  
Tomihiro Kamiya ◽  
Tomohiro Kobayashi
Keyword(s):  
Proton Beam ◽  
Ion Beam ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Proton Beam Writing ◽  
Nitrogen Ion

Nitrogen Ion Beam Irradiation on Amorphous Carbon

2007 ◽  
Vol 539-543 ◽  
pp. 3297-3302
Author(s):  
Yoshihisa Watanabe ◽  
Masami Aono ◽  
Nobuaki Kitazawa
Keyword(s):  
Thin Films ◽  
Amorphous Carbon ◽  
Carbon Nitride ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Energy ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Depth Profiles ◽  
Nitrogen Ion

Both bulk and thin film amorphous carbon were irradiated using a nitrogen ion beam and changes in surface roughness and composition after ion beam irradiation have been studied. Amorphous carbon thin films were prepared from toluene vapor using plasma enhanced chemical vapor deposition. Ion irradiation was performed at room temperature using a nitrogen ion beam and the ion beam energy was varied from 0.2 to 1.5 keV under the constant ion current density. Surface morphology was observed with atomic force microscopy (AFM). Depth profiles of nitrogen in the irradiated specimens were analyzed by X-ray photoelectron spectroscopy (XPS). AFM observations reveal that after the ion beam irradiation the surface of the bulk amorphous carbon becomes rough, while the surface of the amorphous carbon films becomes smooth. However, the notable difference in the surface roughness is hardly observed between low- and high-energy ion irradiation. From XPS studies, it is found that the nitrogen concentration near the surface increases after the ion irradiation for both bulk and thin films and irradiated nitrogen ions are combined with carbon, resulting in formation of carbon nitride layers. Depth profiles of nitrogen show that for the bulk specimen low-energy ion irradiation is more effective for the carbon nitride formation than high-energy ion irradiation, while for the thin films high-energy ions are implanted more deeply than low-energy ions.

Multiple Charged Nitrogen Ion Beam Irradiation of Fullerene Thin Films

2007 ◽  
Vol 15 (2) ◽  
pp. 113-125 ◽  
Author(s):  
B. Todorović‐Marković ◽  
I. Draganić ◽  
Z. Marković ◽  
Z. Stojanović ◽  
M. Mitrić ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Nitrogen Ion
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