Thin Film Sample Holder for an X‐Ray Powder Camera

1971 ◽  
Vol 42 (4) ◽  
pp. 539-540
Author(s):  
A. K. Hochberg
Keyword(s):  
Thin Film ◽  
Thin Film Sample ◽  
Sample Holder ◽  
Film Sample ◽  
X Ray

A curved vacuum deposited thin film sample holder for Seemann-Bohlin diffractometer

1994 ◽  
Vol 209 (6) ◽  
Author(s):  
R. L. Banerjee ◽  
A. Richard
Keyword(s):  
Thin Film ◽  
Maximum Intensity ◽  
Radius Of Curvature ◽  
Thin Film Sample ◽  
Sample Holder ◽  
Film Sample ◽  
X Ray ◽  
Peak Intensity ◽  
Mechanical Linkage

AbstractA sample holder is designed and constructed for the Seemann-Bohlin diffractometer obtained by converting a Siemens horizontal X-ray diffractometer with the help of a mechanical linkage. This sample holder allows one to use a vacuum deposited thin film sample, curved to a radius of curvature equal to that of the diffraction circle. It is found that using a curved sample instead of a flat one increases the peak intensity by about 20% and reduces the profile broadening, measured at half its maximum intensity, from (0.85 ± 0.10)° 4

Study of Different Dislocations in YBCO Thin Film

2003 ◽  
Vol 17 (18n20) ◽  
pp. 3530-3533
Author(s):  
S. X. Wang ◽  
W. L. Liu ◽  
S. H. Han ◽  
H. Zhang
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Screw Dislocation ◽  
Threading Dislocations ◽  
Thin Film Sample ◽  
Ybco Thin Film ◽  
Film Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Out Of Plane

A series thin film sample of YBCO with different value of Tc was studied by high-resolution X-ray diffraction. Two different threading dislocations, the in-plane twist and the out-of-plane tilt, were studied carefully. It is found that the value of Tc is much more sensitive to the substrate normal tilt than to the in-plane twist. Dislocations with different Burgers vectors are suggested to exert different influence on the value of Tc of the YBCO thin film. The screw dislocation in the film is strongly influences the properties of the YBCO.

Drastic improvement in detection limits in energy dispersive X-ray fluorescence geometry utilizing micro-focused bremsstrahlung excitation in thin-film sample specimen

2021 ◽  
Vol 36 (4) ◽  
pp. 803-812
Author(s):  
Kaushik Sanyal ◽  
Buddhadev Kanrar ◽  
Sangita Dhara
Keyword(s):  
Thin Film ◽  
Detection Limit ◽  
Detection Limits ◽  
Energy Dispersive ◽  
Thin Film Sample ◽  
Film Sample ◽  
X Ray

Lowest detection limit achieved down to 0.4–4 ng mL−1 till date in a lab based XRF instrument.

scholarly journals In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample

2013 ◽  
Vol 102 (20) ◽  
pp. 201902 ◽  
Author(s):  
John M. Gregoire ◽  
Kechao Xiao ◽  
Patrick J. McCluskey ◽  
Darren Dale ◽  
Gayatri Cuddalorepatta ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Sample ◽  
Film Sample ◽  
X Ray Diffraction ◽  
X Ray

A valence-selective X-ray fluorescence holography study of an yttrium oxide thin film

2017 ◽  
Vol 50 (6) ◽  
pp. 1583-1589 ◽  
Author(s):  
J. R. Stellhorn ◽  
S. Hosokawa ◽  
N. Happo ◽  
H. Tajiri ◽  
T. Matsushita ◽  
...  
Keyword(s):  
Thin Film ◽  
Absorption Edge ◽  
Structural Information ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Oxide Thin Film ◽  
Film Sample ◽  
Epitaxial Thin Film ◽  
X Ray ◽  
Valence States

The first direct valence-selective structure determination by X-ray fluorescence holography is reported. The method is applied to investigate an epitaxial thin film of the rare earth monoxide YO, which has recently been synthesized by pulsed laser deposition. The surface of the sample is easily oxidized to Y2O3. In order to separate the structural information connected with the two different valence states of Y, the X-ray fluorescence holography measurements were performed close to the YKabsorption edge. Using the shift of the absorption edge for the different valence states, very different relative contributions of YO and Y2O3are obtained. Thus, it is possible to distinguish the crystal structures of YO and Y2O3in the thin-film sample.

Initial Contact Behavior of Nanograined Ni-25at.%Al Film During Nanoindentation

2004 ◽  
Vol 841 ◽  
Author(s):  
Han. Li ◽  
Alfonso H. W. Ngan
Keyword(s):  
Thin Film ◽  
Repeated Loading ◽  
Initial Contact ◽  
Al Alloy ◽  
Alloy Thin Film ◽  
Thin Film Sample ◽  
Film Sample ◽  
Microscopy Imaging ◽  
Contact Stage ◽  
Average Grain Size

ABSTRACTCyclic indentation was performed on standard fused quartz, single crystal Ni3Al (111) and nanocrystalline Ni-25at. %Al alloy thin film with average grain size of a few nanometers. For the thin film sample, it is found the scattering of the effective Young's modulus at small depths goes far beyond the expectation from effects due to surface roughness alone. Three representative deformation mechanisms during initial contact stage were identified to be responsible for the scattering with the assistance of immediate pre and post indentation atomic force microscopy imaging. Furthermore, repeated loading was found to stiffen the thin film sample, but not the bulk ones.

Silver Film Atomic Oxygen Sensors

1972 ◽  
Vol 50 (14) ◽  
pp. 1676-1681 ◽  
Author(s):  
Ronald J. Thomas ◽  
Doran J. Baker
Keyword(s):  
Thin Film ◽  
Atomic Oxygen ◽  
Silver Film ◽  
Surface Recombination ◽  
Oxide Thickness ◽  
Oxygen Sensors ◽  
Recombination Coefficient ◽  
Thin Film Sample ◽  
Film Sample ◽  
Initial Oxidation

Measurements indicate that the initial oxidation rate of a thin film of silver is linearly proportional to the atomic oxygen flux; however, the oxidation coefficient is dependent upon the technique for depositing and chemically reducing the thin film. A model is developed relating the conductance of a thin-film sample to its oxidation. The measurements and the model indicate that the silver film is very promising as a sensor of upper atmospheric atomic oxygen. The model also indicates that the surface recombination coefficient of atomic oxygen depends on the oxide thickness as well as the flux.

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