Reinvestigation of CS2 dissociation at 193 nm by means of product state-selective vacuum ultraviolet laser ionization and velocity imaging

2004 ◽  
Vol 120 (7) ◽  
pp. 3051-3054 ◽  
Author(s):  
Dadong Xu ◽  
Jianhua Huang ◽  
William M. Jackson
1992 ◽  
Vol 285 ◽  
Author(s):  
Peter R. Herman ◽  
Boyi Chen ◽  
David J. Moore

ABSTRACTVacuum-ultraviolet laser ablation of Teflon is reviewed. The 157 nm irradiation of Teflon produces clean ablation sites well suited to micromachining applications in the electronics and medical fields. At 193 nm, etching profiles are poorly defined, showing swelling characteristics commonly produced by longer wavelength lasers. Comprehensive new 193 nm ablation data are presented showing the first evidence of incubation effects for Teflon. A computer model was developed to include ablation, swelling and incubation processes. The computer results satisfactorily model the experimental data over a large fluence range of 0.6 to 13 J/cm2 with three adjustable parameters.


Author(s):  
William M. Jackson ◽  
Dadong Xu ◽  
Roosevelt J. Price ◽  
Kevin L. McNesby ◽  
Ian A. McLaren

2007 ◽  
Author(s):  
Shoichi Kubodera ◽  
Yuta Taniguchi ◽  
Akira Hosotani ◽  
Masahito Katto ◽  
Atsushi Yokotani ◽  
...  

2013 ◽  
Vol 362 ◽  
pp. 167-169 ◽  
Author(s):  
Marilou Cadatal-Raduban ◽  
Toshihiko Shimizu ◽  
Kohei Yamanoi ◽  
Kohei Takeda ◽  
Minh Hong Pham ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document