Radio Frequency Circuitry for Atomic Force Microscopy up to 100 MHz

2003 ◽  
Author(s):  
Dai Kobayashi
2008 ◽  
Vol 3 (1) ◽  
pp. 32-35
Author(s):  
Ojas Mahapatra ◽  
R. Maheswaran ◽  
B. Purna Chandra Rao ◽  
C. Gopalakrishnan ◽  
D. John Thiruvadigal

2010 ◽  
Vol 663-665 ◽  
pp. 361-364
Author(s):  
Yan Yan Zhu ◽  
Ze Bo Fang

Al doped Er2O3 films were deposited on Si(001) substrates by radio frequency magnetron technique. X-ray diffraction and atomic force microscopy show the Al doped Er2O3 films obtained are amorphous and uniform. The optical constants are studied which shows a proper value of refractive index and a lower reflectivity, indicating it could be a usefully material for solar cells.


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