Effect of intrinsic point defects on copper precipitation in large-diameter Czochralski silicon

2003 ◽  
Vol 83 (15) ◽  
pp. 3048-3050 ◽  
Author(s):  
Zhenqiang Xi ◽  
Deren Yang ◽  
Jin Xu ◽  
Yujie Ji ◽  
Duanlin Que ◽  
...  
Keyword(s):  
Point Defects ◽  
Large Diameter ◽  
Czochralski Silicon ◽  
Intrinsic Point Defects ◽  
Copper Precipitation

Copper precipitation in large-diameter Czochralski silicon

2005 ◽  
Vol 97 (9) ◽  
pp. 094909 ◽  
Author(s):  
Zhenqiang Xi ◽  
Jun Chen ◽  
Deren Yang ◽  
A. Lawerenz ◽  
H. J. Moeller
Keyword(s):  
Large Diameter ◽  
Czochralski Silicon ◽  
Copper Precipitation

Intrinsic point defects and charge carrier trapping in monolayer BiOX (X = I, Br, and Cl)

2021 ◽  
Author(s):  
Haixi Pan ◽  
Liping Feng ◽  
Xiaodong Zhang ◽  
Yang Chen ◽  
Gangquan Li ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Point Defects ◽  
Carrier Trapping ◽  
Intrinsic Point Defects ◽  
Charge Carrier Trapping
Sign in / Sign up

Export Citation Format

Share Document