Determination of the anisotropic dielectric function for wurtzite AlN and GaN by spectroscopic ellipsometry

2003 ◽  
Vol 94 (1) ◽  
pp. 307-312 ◽  
Author(s):  
S. Shokhovets ◽  
R. Goldhahn ◽  
G. Gobsch ◽  
S. Piekh ◽  
R. Lantier ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Anisotropic Dielectric

Determination of the complex dielectric function of ion implanted amorphous SiC by spectroscopic ellipsometry

2003 ◽  
Vol 195 (1) ◽  
pp. 277-281 ◽  
Author(s):  
E. R. Shaaban ◽  
T. Lohner ◽  
P. Petrik ◽  
N. Q. Khánh ◽  
M. Fried ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Complex Dielectric Function ◽  
Amorphous Sic ◽  
Ion Implanted

Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry

2000 ◽  
Vol 338-342 ◽  
pp. 571-574 ◽  
Author(s):  
Morten Kildemo ◽  
M.B. Mooney ◽  
P.V. Kelly ◽  
C. Sudre ◽  
G.M. Crean
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Anisotropic Dielectric

Determination of the anisotropic dielectric function for metal free phthalocyanine thin films

2004 ◽  
Vol 455-456 ◽  
pp. 551-556 ◽  
Author(s):  
O.D. Gordan ◽  
M. Friedrich ◽  
D.R.T. Zahn
Keyword(s):  
Thin Films ◽  
Dielectric Function ◽  
Anisotropic Dielectric ◽  
Metal Free

Determination of the dielectric function of MnIn2S4 single crystals by spectroscopic ellipsometry

2012 ◽  
Vol 73 (6) ◽  
pp. 720-723 ◽  
Author(s):  
M. León ◽  
S. Levcenko ◽  
I. Bodnar ◽  
R. Serna ◽  
J.M. Merino ◽  
...  
Keyword(s):  
Single Crystals ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants
Sign in / Sign up

Export Citation Format

Share Document