Determination of the dielectric function of MnIn2S4 single crystals by spectroscopic ellipsometry

2012 ◽  
Vol 73 (6) ◽  
pp. 720-723 ◽  
Author(s):  
M. León ◽  
S. Levcenko ◽  
I. Bodnar ◽  
R. Serna ◽  
J.M. Merino ◽  
...  
Keyword(s):  
Single Crystals ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Determination of the complex dielectric function of ion implanted amorphous SiC by spectroscopic ellipsometry

2003 ◽  
Vol 195 (1) ◽  
pp. 277-281 ◽  
Author(s):  
E. R. Shaaban ◽  
T. Lohner ◽  
P. Petrik ◽  
N. Q. Khánh ◽  
M. Fried ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Complex Dielectric Function ◽  
Amorphous Sic ◽  
Ion Implanted

Determination of the anisotropic dielectric function for wurtzite AlN and GaN by spectroscopic ellipsometry

2003 ◽  
Vol 94 (1) ◽  
pp. 307-312 ◽  
Author(s):  
S. Shokhovets ◽  
R. Goldhahn ◽  
G. Gobsch ◽  
S. Piekh ◽  
R. Lantier ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Anisotropic Dielectric

scholarly journals Эллипсометрические исследования монокристаллов Bi-=SUB=-2-=/SUB=-Se-=SUB=-3-=/SUB=- и Bi-=SUB=-2-=/SUB=-Se-=SUB=-3-=/SUB=-<Cu>

2021 ◽  
Vol 55 (8) ◽  
pp. 665
Author(s):  
Ш.К. Гудавасов ◽  
Н.A. Абдуллаев ◽  
Д.Н. Джалилли ◽  
З.И. Бадалова ◽  
И.А. Мамедова ◽  
...  
Keyword(s):  
Experimental Data ◽  
Refractive Index ◽  
Optical Properties ◽  
Dispersion Relation ◽  
Energy Range ◽  
Single Crystals ◽  
Dielectric Function ◽  
Photon Energy ◽  
Spectroscopic Ellipsometry ◽  
Extinction Coefficient

In this work, by spectroscopic ellipsometry the imaginary and real parts of the dielectric function of Bi2Se3 and Bi2Se3<Cu> single crystals were obtained in the photon energy range from 0.7 eV to 6.5 eV, and were determined the energies of allowed direct transitions responsible for some optical properties. By the help of Cody-Lorentz and Lorentz optical oscillators, the dispersion relation is adjusted in conformity with the experimental data. The values of the refractive index n and the extinction coefficient k of Bi2Se3 single crystals are calculated in the energy range from 0.7 eV to 6.5 eV. It was also determined that the maximum absorption corresponds to the transitions at 1.900 eV and 1.949 eV for Bi2Se3 and Bi2Se3<Cu>, respectively.

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

Two lithium tricyanomethanide compounds: syntheses and single-crystal structure determination of LiK[C(CN)3]2 and Li[C(CN)3]·½ (H3C)2CO

2015 ◽  
Vol 70 (3) ◽  
pp. 191-196 ◽  
Author(s):  
Olaf Reckeweg ◽  
Francis J. DiSalvo
Keyword(s):  
Crystal Structure ◽  
Single Crystal ◽  
Single Crystals ◽  
Structure Determination ◽  
Monoclinic Space Group ◽  
Orthorhombic Space Group ◽  
Space Group ◽  
Cell Parameters ◽  
New Compounds

AbstractThe new compounds LiK[C(CN)3]2 and Li[C(CN)3]·½ (H3C)2CO were synthesized and their crystal structures were determined. Li[C(CN)3]·½ (H3C)2CO crystallizes in the orthorhombic space group Ima2 (no. 46) with the cell parameters a=794.97(14), b=1165.1(2) and c=1485.4(3) pm, while LiK[C(CN)3]2 adopts the monoclinic space group P21/c (no. 14) with the cell parameters a=1265.7(2), b=1068.0(2) and c=778.36(12) pm and the angle β=95.775(7)°. Single crystals of K[C(CN)3] were also acquired, and the crystal structure was refined more precisely than before corroborating earlier results.

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants
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