Near-Field Scanning Microwave Microscope Using a Dielectric Resonator

2003 ◽  
Author(s):  
Jooyoung Kim
Keyword(s):  
Dielectric Resonator ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Near-field scanning microwave microscope using a dielectric resonator

2003 ◽  
Vol 83 (5) ◽  
pp. 1032-1034 ◽  
Author(s):  
Jooyoung Kim ◽  
Kiejin Lee ◽  
Barry Friedman ◽  
Deokjoon Cha
Keyword(s):  
Dielectric Resonator ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Near-field scanning microwave probe based on a dielectric resonator

2001 ◽  
Vol 72 (4) ◽  
pp. 2073-2079 ◽  
Author(s):  
M. Abu-Teir ◽  
M. Golosovsky ◽  
D. Davidov ◽  
A. Frenkel ◽  
H. Goldberger
Keyword(s):  
Dielectric Resonator ◽  
Near Field ◽  
Microwave Probe ◽  
Near Field Scanning

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope

2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Near Field ◽  
Silicon Solar Cells ◽  
Microwave Microscope ◽  
Near Field Scanning

Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope

2006 ◽  
Vol 499 (1-2) ◽  
pp. 318-321 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Hyungun Yoo ◽  
Seungwook Na ◽  
Songhui Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Label-Free DNA Detection Using a Near-Field Microwave

2006 ◽  
Vol 321-323 ◽  
pp. 1040-1043
Author(s):  
Kie Jin Lee ◽  
Arsen Babajayan ◽  
Song Hui Kim
Keyword(s):  
Dna Binding ◽  
Near Field ◽  
Physical Property ◽  
Label Free ◽  
Specific Sequence ◽  
Microwave Microscope ◽  
Dna Strands ◽  
Amplification Process ◽  
Target Probe ◽  
Near Field Scanning

A near-field scanning microwave microscope (NSMM) is used to study the physical properties of DNA strands with a specific sequence and image lamda-DNA bundles. After the hybridization process between target and capture sequences, specific DNA binding events leads to microwave reflection coefficient (S11) changes of the NSMM. These changes are caused by a modification of the physical dielectric constant due to sequence specific DNA binding. This study demonstrates significant potential of the NSMM as a nondestructive and noncontact tool to detect DNA strands without a target-probe amplification process and as a valuable technique to understand the physical property of DNA.

Improving images from a near-field scanning microwave microscope using a hybrid probe

2003 ◽  
Vol 83 (5) ◽  
pp. 1026-1028 ◽  
Author(s):  
Jooyoung Kim ◽  
Myungsick Kim ◽  
Hyun Kim ◽  
Doohee Song ◽  
Kiejin Lee ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning
Sign in / Sign up

Export Citation Format

Share Document