Improved near-field scanning microwave microscope combined with electrical transport measurement for characterizing nonuniformity of electrical dissipation in YBa2Cu3O7−δ films of variable thickness
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2009 ◽
Vol 57
(5)
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pp. 1224-1229
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2006 ◽
Vol 321-323
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pp. 1040-1043
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2007 ◽
Vol 78
(6)
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pp. 063702
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2013 ◽
Vol 84
(2)
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pp. 023706
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