Noise performance of polycrystalline silicon thin-film transistors made by sequential lateral solidification

2003 ◽  
Vol 82 (16) ◽  
pp. 2709-2711 ◽  
Author(s):  
A. Bonfiglietti ◽  
A. Valletta ◽  
L. Mariucci ◽  
A. Pecora ◽  
G. Fortunato
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Sequential Lateral Solidification

Empirical noise performance of prototype active pixel arrays employing polycrystalline silicon thin‐film transistors

2020 ◽  
Vol 47 (9) ◽  
pp. 3972-3983
Author(s):  
Martin Koniczek ◽  
Larry E. Antonuk ◽  
Youcef El‐Mohri ◽  
Albert K. Liang ◽  
Qihua Zhao
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Active Pixel

Hot-carrier-induced modifications to the noise performance of polycrystalline silicon thin-film transistors

1997 ◽  
Vol 71 (9) ◽  
pp. 1216-1218 ◽  
Author(s):  
S. Giovannini ◽  
R. Carluccio ◽  
L. Mariucci ◽  
A. Pecora ◽  
G. Fortunato ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Hot Carrier

scholarly journals Theoretical investigation of the noise performance of active pixel imaging arrays based on polycrystalline silicon thin film transistors

2017 ◽  
Vol 44 (7) ◽  
pp. 3491-3503 ◽  
Author(s):  
Martin Koniczek ◽  
Larry E. Antonuk ◽  
Youcef El-Mohri ◽  
Albert K. Liang ◽  
Qihua Zhao
Keyword(s):  
Thin Film ◽  
Theoretical Investigation ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Imaging Arrays ◽  
Active Pixel

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Dynamic-Gate-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

2016 ◽  
Vol 63 (10) ◽  
pp. 3964-3970 ◽  
Author(s):  
Meng Zhang ◽  
Zhihe Xia ◽  
Wei Zhou ◽  
Rongsheng Chen ◽  
Man Wong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film
Sign in / Sign up

Export Citation Format

Share Document