Influence of stacking faults on the performance of 4H–SiC Schottky barrier diodes fabricated on (112̄0) face
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2003 ◽
Vol 433-436
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pp. 925-928
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2007 ◽
pp. 885-888
2016 ◽
Vol 136
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pp. 479-483
2019 ◽
Vol 780
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pp. 476-481
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