Spontaneous Hall-effect studies on ion-beam-deposited GdCoZr amorphous alloy thin-film sensors

2002 ◽  
Vol 91 (10) ◽  
pp. 7439 ◽  
Author(s):  
M. Manivel Raja ◽  
K. W. Lin ◽  
R. J. Gambino
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Hall Effect ◽  
Ion Beam ◽  
Alloy Thin Film ◽  
Thin Film Sensors

Plan-View Preparation of TEM Specimens from Thin Films Using Adhesive Tape

2011 ◽  
Vol 17 (6) ◽  
pp. 886-888
Author(s):  
Zsolt Czigány
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grain Size ◽  
Nanostructured Materials ◽  
Ion Beam ◽  
Adhesive Tape ◽  
Alloy Thin Film ◽  
Preparation Technique ◽  
Plan View ◽  
High Resolution Tem

AbstractA simple plan-view sample preparation technique for transmission electron microscopy (TEM) specimens is proposed for thin films by tearing-off the film with adhesive tape. The demand for very thin samples is highest for nanostructured materials where the structure of 2–5 nm sized features (grains) needs to be resolved; therefore, overlapping of nanometer-sized features should be avoided. The method provides thin areas at the fracture edges of plan-view specimens with thickness in the range of the grain size in the film allowing for artifact free high-resolution TEM imaging. Nanostructured materials typically fracture between the grains providing areas with the thickness of the grain size. Besides the swiftness of the method, the samples are free of surface amorphization artifacts, which can occur in ion beam milling up to 1 nm depth even at low energy ion bombardment. The thin film tear-off technique is demonstrated on a CuMn alloy thin film with grain size of 2 nm.

scholarly journals Measurement of crystallization temperature of Pd-based amorphous alloy thin film by energy dispersive X-ray reflectometry

2009 ◽  
Vol 34 (4) ◽  
pp. 627-629
Author(s):  
Tokujiro Yamamoto ◽  
Kouichi Hayashi ◽  
Kosuke Suzuki ◽  
Masahisa Ito ◽  
Hisamichi Kimura ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Crystallization Temperature ◽  
Energy Dispersive ◽  
Alloy Thin Film ◽  
X Ray

scholarly journals Evaluation of the Elastic Constants of an Amorphous-Alloy Thin Film by Using EMAR and RUS/Laser Methods

2005 ◽  
Vol 54 (10) ◽  
pp. 1012-1015 ◽  
Author(s):  
Akira SHIBATA ◽  
Ryuichi TARUMI ◽  
Hirotsugu OGI ◽  
Masahiko HIRAO ◽  
Kazuki TAKASHIMA ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Elastic Constants ◽  
Alloy Thin Film

scholarly journals Elastic anisotropy of an Fe79Si12B9 amorphous alloy thin film studied by ultrasound spectroscopy

2007 ◽  
Vol 101 (5) ◽  
pp. 053519 ◽  
Author(s):  
Ryuichi Tarumi ◽  
Akira Shibata ◽  
Hirotsugu Ogi ◽  
Masahiko Hirao ◽  
Kazuki Takashima ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Elastic Anisotropy ◽  
Alloy Thin Film

scholarly journals Jounng o Titanium Using Ag-Cu Alloy Thin Film Deposited on Bonding Surface with Ion Beam Sputtering.

2000 ◽  
Vol 49 (7) ◽  
pp. 767-773
Author(s):  
Akio HIROSE ◽  
Makoto NOJIRI ◽  
Hirotake ITO ◽  
Kojiro F. KOBAYASHI
Keyword(s):  
Thin Film ◽  
Ion Beam ◽  
Alloy Thin Film ◽  
Ion Beam Sputtering ◽  
Cu Alloy ◽  
Beam Sputtering ◽  
Bonding Surface

Novel soft-magnetic underlayer of a bit-patterned media using CoFe-based amorphous alloy thin film

2012 ◽  
Vol 30 ◽  
pp. 100-103
Author(s):  
Kana Takenaka ◽  
Noriko Saidoh ◽  
Nobuyuki Nishiyama ◽  
Manabu Ishimaru ◽  
Akihisa Inoue
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Alloy Thin Film ◽  
Soft Magnetic ◽  
Bit Patterned Media ◽  
Patterned Media
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