scholarly journals Measurement of crystallization temperature of Pd-based amorphous alloy thin film by energy dispersive X-ray reflectometry

2009 ◽  
Vol 34 (4) ◽  
pp. 627-629
Author(s):  
Tokujiro Yamamoto ◽  
Kouichi Hayashi ◽  
Kosuke Suzuki ◽  
Masahisa Ito ◽  
Hisamichi Kimura ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Crystallization Temperature ◽  
Energy Dispersive ◽  
Alloy Thin Film ◽  
X Ray

scholarly journals A Method for Metal/Protein Stoichiometry Determination Using Thin-Film Energy Dispersive X-ray Fluorescence Spectroscopy

2019 ◽  
Vol 91 (18) ◽  
pp. 11502-11506 ◽  
Author(s):  
Silvia Fruncillo ◽  
Matteo Trande ◽  
Christopher F. Blanford ◽  
Alessandra Astegno ◽  
Lu Shin Wong
Keyword(s):  
Thin Film ◽  
Fluorescence Spectroscopy ◽  
Energy Dispersive ◽  
X Ray

Determining Thin Film Density by Energy-Dispersive X-Ray Reflectivity: Application to a Spin-on-Glass Dielectric

1995 ◽  
Vol 405 ◽  
Author(s):  
W. E. Wallace ◽  
W. L. Wu
Keyword(s):  
Thin Film ◽  
Critical Angle ◽  
Energy Dispersive ◽  
Ion Scattering ◽  
Reflectivity Measurement ◽  
X Ray ◽  
Film Density ◽  
Novel Method ◽  
Improved Accuracy

AbstractA novel method for determining thin film density by energy dispersive x-ray reflectivity is demonstrated for a polymer-derived spin-on-glass dielectric intended for microelectronics applications. The effects of sample misalignment limit the accuracy of x-ray reflectivity as typically practiced. These effects may be properly accounted for by measuring the critical angle for reflection at many different x-ray wavelengths simultaneously. From this measurement, thin film density can be ascertained with much improved accuracy. The results of the x-ray reflectivity measurement are compared to those derived from MeV ion scattering.

Measurement of Crystallization Temperature Using Thermography for Thin Film Amorphous Alloy Samples

2009 ◽  
Vol 2 ◽  
pp. 036501 ◽  
Author(s):  
Seiichi Hata ◽  
Yuko Aono ◽  
Junpei Sakurai ◽  
Akira Shimokohbe
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Crystallization Temperature

scholarly journals Energy dispersive x-ray spectroscopy for nanostructured thin film density evaluation

2015 ◽  
Vol 16 (2) ◽  
pp. 025007 ◽  
Author(s):  
Irene Prencipe ◽  
David Dellasega ◽  
Alessandro Zani ◽  
Daniele Rizzo ◽  
Matteo Passoni
Keyword(s):  
Thin Film ◽  
Energy Dispersive ◽  
X Ray ◽  
Film Density ◽  
Nanostructured Thin Film ◽  
Density Evaluation

437 Measurement of crystallization temperature on thin film amorphous alloy library by thermography

2009 ◽  
Vol 2009.17 (0) ◽  
pp. _437-1_-_437-2_
Author(s):  
Yuko AONO ◽  
Seiichi HATA ◽  
Junpei SAKURAI ◽  
Akira SHIMOKOHBE
Keyword(s):  
Thin Film ◽  
Amorphous Alloy ◽  
Crystallization Temperature

Determination of polarity in noncentrosymmetric layer/substrate systems

1999 ◽  
Vol 32 (5) ◽  
pp. 854-858 ◽  
Author(s):  
Dirk C. Meyer ◽  
Kurt Richter ◽  
Hans-Georg Krane ◽  
Wolfgang Morgenroth ◽  
Peter Paufler
Keyword(s):  
Thin Film ◽  
Gaas Substrate ◽  
Energy Dispersive ◽  
Energy Spectra ◽  
Routine Procedure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Energy-dispersive anomalous X-ray scattering has been used for the determination of the polarity of a noncentrosymmetric layer/substrate system. The method was applied to an epitaxically grown (Ga,In)P layer on a (001) GaAs substrate as an example to show its applicability as a routine procedure for noncentrosymmetric thin-film systems. In the simplest case, four energy spectra of various orders of the 111 reflections were sufficient to identify polarity, without the need for intensity corrections.

Soil analysis by thin-film energy-dispersive x-ray fluorescence

1979 ◽  
Vol 108 ◽  
pp. 93-101 ◽  
Author(s):  
R. Van Grieken ◽  
L. Van't Dack ◽  
C. Costa Dantas ◽  
H. Da Silveira Dantas
Keyword(s):  
Thin Film ◽  
Soil Analysis ◽  
Energy Dispersive ◽  
X Ray
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