Study on the effect of plasma treatment on TiN films in N2/H2 atmosphere using x-ray reflectivity and secondary ion mass spectroscopy

2002 ◽  
Vol 80 (3) ◽  
pp. 512-514 ◽  
Author(s):  
S. Banerjee ◽  
A. Gibaud ◽  
D. Chateigner ◽  
S. Ferrari ◽  
C. Wiemer ◽  
...  
Keyword(s):  
Plasma Treatment ◽  
Mass Spectroscopy ◽  
Secondary Ion Mass Spectroscopy ◽  
Tin Films ◽  
X Ray ◽  
Secondary Ion

scholarly journals Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽  
1995 ◽  
Vol 38 (3) ◽  
pp. 295-298 ◽  
Author(s):  
Wen Biao YING ◽  
Yusuke MIZOKAWA ◽  
Yoshitomo KAMIURA ◽  
Yong Bing YU ◽  
Masafumi NISHIMATSU ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Surfaces ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Doped Silicon ◽  
Phosphorus Doped ◽  
Secondary Ion

Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings

1998 ◽  
Vol 28 (10) ◽  
pp. 1464-1470 ◽  
Author(s):  
Ronald R Martin ◽  
T K Sham ◽  
G Wong Won ◽  
Paul van der Heide ◽  
Keith W Jones ◽  
...  
Keyword(s):  
Tree Rings ◽  
Mass Spectroscopy ◽  
Metal Content ◽  
Fluorescence Analysis ◽  
Ring System ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Qualitative Variation ◽  
Secondary Ion ◽  
Cu And Zn

Secondary ion mass spectroscopy and synchrotron X-ray fluorescence analysis have been used to document the changes in metal content across the ring system of trees from northern Canada. The results show a seasonal qualitative variation in the uptake of Na, Al, K, Ca, Cr, Mn, Fe, Cu, and Zn. Diffusional models show that locally elevated concentrations of selected metals are sufficiently stable within individual rings that variations in content among rings remain at detectable levels for at least a century.

Analysis of the composition of (Al,Ga)As alloys by secondary ion mass spectroscopy and X-ray diffractometry

2012 ◽  
Vol 46 (11) ◽  
pp. 1392-1395 ◽  
Author(s):  
Yu. N. Drozdov ◽  
M. N. Drozdov ◽  
V. M. Daniltsev ◽  
O. I. Khrikin ◽  
P. A. Yunin
Keyword(s):  
Mass Spectroscopy ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion
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