Fast x-ray scattering measurements on molten alumina using a 120° curved position sensitive detector

2002 ◽  
Vol 73 (1) ◽  
pp. 124-129 ◽  
Author(s):  
Louis Hennet ◽  
Dominique Thiaudière ◽  
Marc Gailhanou ◽  
Claude Landron ◽  
Jean-Pierre Coutures ◽  
...  
Keyword(s):  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Position Sensitive ◽  
Ray Scattering

A position-sensitive detector system for the measurement of diffuse X-ray scattering

1990 ◽  
Vol 23 (6) ◽  
pp. 476-484 ◽  
Author(s):  
J. C. Osborn ◽  
T. R. Welberry
Keyword(s):  
Counting Efficiency ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
One Dimensional ◽  
X Ray ◽  
Intensity Measurements ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Position Sensitive ◽  
Ray Scattering

The use of a one-dimensional position-sensitive detector for diffuse X-ray scattering measurements is described. Calibration procedures for scattering angle and intensity measurements are discussed. Some nonuniformities have been found in the counting efficiency as a function of distance along the detector. A procedure is described for measuring the diffuse scattering in a section of reciprocal space.

scholarly journals Small-Angle X-Ray Scattering System with Linear Position-Sensitive Detector

1982 ◽  
Vol 29 (1) ◽  
pp. 275-278 ◽  
Author(s):  
A. R. Forouhi ◽  
B. Sleaford ◽  
V. Perez-Mendez ◽  
D. de Fontaine ◽  
J. Fodor
Keyword(s):  
Small Angle ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Scattering System ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

scholarly journals An Apparatus for High Speed Measurements of Small-Angle X-Ray Scattering Profiles with a Linear Position Sensitive Detector

1981 ◽  
Vol 13 (5) ◽  
pp. 501-516 ◽  
Author(s):  
Takeji Hashimoto ◽  
Shoji Suehiro ◽  
Mitsuhiro Shibayama ◽  
Kenji Sauo ◽  
Hiromichi Kawai
Keyword(s):  
Small Angle ◽  
High Speed ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

Advantages in the Small-Angle Scattering of X-Ray for Studying Optoelectronic Devices within the Frames of ISTC Projects

2010 ◽  
Vol 437 ◽  
pp. 641-645 ◽  
Author(s):  
Michael E. Boiko ◽  
Andrei M. Boiko
Keyword(s):  
Small Angle ◽  
Layer Structure ◽  
Energy Shift ◽  
High Energy ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Position Sensitive

The project ISTC “SPECTROMETRIC POSITION SENSITIVE DETECTOR WITH BASE ENERGY SHIFT” is interesting for creation new area semiconductor detector device for EXAFS spectroscopy, for traditional X-ray diffractometry (XRD), as well as Small-Angle X-ray Scattering diffractometry (SASX). Diffractometry methods allow creating original features of position sensitive detector. Crystallography quality of silicon multi layer detector with original photo mask was examined by XRD and SAXS with ordinary scintillation detectors. Grazed incidence SAXS (GISAXS) provides information both about lateral and normal ordering of multilayers at a surface or inside a thin epitaxial film [1]. Using high-energy X-ray source (rotating anode or synchrotron radiation in future) and high adjustment monochromator SAXS rocking curves in transition and reflection mode had been received. It allows obtaining the information of 3D size lamellar or column-like domains. Results of an experimental investigation of the size layer structure are presented.

Control of the phase composition of advanced calcium phosphates using an x-ray diffractometer with a curved position-sensitive detector

2020 ◽  
Vol 86 (6) ◽  
pp. 29-35
Author(s):  
V. P. Sirotinkin ◽  
O. V. Baranov ◽  
A. Yu. Fedotov ◽  
S. M. Barinov
Keyword(s):  
Phase Composition ◽  
Calcium Phosphates ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
Impurity Phases ◽  
Position Sensitive ◽  
Diffraction Peaks ◽  
Diffraction Patterns

The results of studying the phase composition of advanced calcium phosphates Ca10(PO4)6(OH)2, β-Ca3(PO4)2, α-Ca3(PO4)2, CaHPO4 · 2H2O, Ca8(HPO4)2(PO4)4 · 5H2O using an x-ray diffractometer with a curved position-sensitive detector are presented. Optimal experimental conditions (angular positions of the x-ray tube and detector, size of the slits, exposure time) were determined with allowance for possible formation of the impurity phases during synthesis. The construction features of diffractometers with a position-sensitive detector affecting the profile characteristics of x-ray diffraction peaks are considered. The composition for calibration of the diffractometer (a mixture of sodium acetate and yttrium oxide) was determined. Theoretical x-ray diffraction patterns for corresponding calcium phosphates are constructed on the basis of the literature data. These x-ray diffraction patterns were used to determine the phase composition of the advanced calcium phosphates. The features of advanced calcium phosphates, which should be taken into account during the phase analysis, are indicated. The powder of high-temperature form of tricalcium phosphate strongly adsorbs water from the environment. A strong texture is observed on the x-ray diffraction spectra of dicalcium phosphate dihydrate. A rather specific x-ray diffraction pattern of octacalcium phosphate pentahydrate revealed the only one strong peak at small angles. In all cases, significant deviations are observed for the recorded angular positions and relative intensity of the diffraction peaks. The results of the study of experimentally obtained mixtures of calcium phosphate are presented. It is shown that the graphic comparison of experimental x-ray diffraction spectra and pre-recorded spectra of the reference calcium phosphates and possible impurity phases is the most effective method. In this case, there is no need for calibration. When using this method, the total time for analysis of one sample is no more than 10 min.

Small angle x-ray scattering measurements of lithographic patterns with sidewall roughness from vertical standing waves

2007 ◽  
Vol 90 (19) ◽  
pp. 193122 ◽  
Author(s):  
Chengqing Wang ◽  
Ronald L. Jones ◽  
Eric K. Lin ◽  
Wen-Li Wu ◽  
Jim Leu
Keyword(s):  
Small Angle ◽  
Standing Waves ◽  
Sidewall Roughness ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering
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