scholarly journals An Apparatus for High Speed Measurements of Small-Angle X-Ray Scattering Profiles with a Linear Position Sensitive Detector

1981 ◽  
Vol 13 (5) ◽  
pp. 501-516 ◽  
Author(s):  
Takeji Hashimoto ◽  
Shoji Suehiro ◽  
Mitsuhiro Shibayama ◽  
Kenji Sauo ◽  
Hiromichi Kawai
Keyword(s):  
Small Angle ◽  
High Speed ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

scholarly journals Small-Angle X-Ray Scattering System with Linear Position-Sensitive Detector

1982 ◽  
Vol 29 (1) ◽  
pp. 275-278 ◽  
Author(s):  
A. R. Forouhi ◽  
B. Sleaford ◽  
V. Perez-Mendez ◽  
D. de Fontaine ◽  
J. Fodor
Keyword(s):  
Small Angle ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Scattering System ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

Fast x-ray scattering measurements on molten alumina using a 120° curved position sensitive detector

2002 ◽  
Vol 73 (1) ◽  
pp. 124-129 ◽  
Author(s):  
Louis Hennet ◽  
Dominique Thiaudière ◽  
Marc Gailhanou ◽  
Claude Landron ◽  
Jean-Pierre Coutures ◽  
...  
Keyword(s):  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Position Sensitive ◽  
Ray Scattering

Advantages in the Small-Angle Scattering of X-Ray for Studying Optoelectronic Devices within the Frames of ISTC Projects

2010 ◽  
Vol 437 ◽  
pp. 641-645 ◽  
Author(s):  
Michael E. Boiko ◽  
Andrei M. Boiko
Keyword(s):  
Small Angle ◽  
Layer Structure ◽  
Energy Shift ◽  
High Energy ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Position Sensitive

The project ISTC “SPECTROMETRIC POSITION SENSITIVE DETECTOR WITH BASE ENERGY SHIFT” is interesting for creation new area semiconductor detector device for EXAFS spectroscopy, for traditional X-ray diffractometry (XRD), as well as Small-Angle X-ray Scattering diffractometry (SASX). Diffractometry methods allow creating original features of position sensitive detector. Crystallography quality of silicon multi layer detector with original photo mask was examined by XRD and SAXS with ordinary scintillation detectors. Grazed incidence SAXS (GISAXS) provides information both about lateral and normal ordering of multilayers at a surface or inside a thin epitaxial film [1]. Using high-energy X-ray source (rotating anode or synchrotron radiation in future) and high adjustment monochromator SAXS rocking curves in transition and reflection mode had been received. It allows obtaining the information of 3D size lamellar or column-like domains. Results of an experimental investigation of the size layer structure are presented.

A position-sensitive detector system for the measurement of diffuse X-ray scattering

1990 ◽  
Vol 23 (6) ◽  
pp. 476-484 ◽  
Author(s):  
J. C. Osborn ◽  
T. R. Welberry
Keyword(s):  
Counting Efficiency ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
One Dimensional ◽  
X Ray ◽  
Intensity Measurements ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Position Sensitive ◽  
Ray Scattering

The use of a one-dimensional position-sensitive detector for diffuse X-ray scattering measurements is described. Calibration procedures for scattering angle and intensity measurements are discussed. Some nonuniformities have been found in the counting efficiency as a function of distance along the detector. A procedure is described for measuring the diffuse scattering in a section of reciprocal space.

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Proportional Counter ◽  
Anisotropic Scattering ◽  
Photon Flux ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.

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