Thermal stability of exchange coupling in permalloy/FeMn bilayers and its dependence on the antiferromagnetic layer thickness

2002 ◽  
Vol 91 (4) ◽  
pp. 2243-2246 ◽  
Author(s):  
H. Y. Li ◽  
L. Y. Chen ◽  
S. M. Zhou
Keyword(s):  
Thermal Stability ◽  
Layer Thickness ◽  
Exchange Coupling ◽  
Antiferromagnetic Layer ◽  
Thermal Stability Of

Improved Thermal Stability of Gmr Spin Valve Films

1995 ◽  
Vol 384 ◽  
Author(s):  
R. D. Mcmichael ◽  
W. F. Egelhoff ◽  
Minh Ha
Keyword(s):  
Thermal Stability ◽  
Layer Thickness ◽  
Annealing Time ◽  
General Structure ◽  
Spin Valve ◽  
Square Root ◽  
Magnetic Multilayer ◽  
Valve Structure ◽  
Thermal Stability Of

ABSTRACTIn order to improve the thermal stability of magnetic multilayer “spin valve” structures, we have measured the magnetic and magnetoresistive properties of a number of samples with the general structure of NiO/Co/Cu/Co/Cu/Co/NiO as a function of annealing time at 250 °C. The magnetoresistance (MR) of the samples annealed in air decreases proportionally to the square root of the annealing time. For samples annealed in a vacuum, the decrease in magnetoresistance is reduced, but not eliminated. Magnetometry of a vacuum annealed NiO/Co/NiO sample shows a magnetization reduction and a coercivity increase which suggest oxidation of the NiO-biased “outer” Co layers of the spin valve structure. For increasing NiObiased Co layer thickness, we show enhanced thermal stability and even increasing MR with annealing time for samples with the thickest outer Co layers.

High exchange-coupling field and thermal stability of antiferromagnetic Ir-Mn pinned spin-valve films

2002 ◽  
Vol 38 (5) ◽  
pp. 2764-2766 ◽  
Author(s):  
J.Y. Hwang ◽  
M.Y. Kim ◽  
J.R. Rhee ◽  
S.S. Lee ◽  
D.G. Hwang ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Exchange Coupling ◽  
Spin Valve ◽  
Coupling Field ◽  
Thermal Stability Of

scholarly journals Layer Thickness Dependence of the Thermal Stability of Spin-Valve Films

1998 ◽  
Vol 22 (4_2) ◽  
pp. 489-492 ◽  
Author(s):  
H. Hoshiya ◽  
K. Meguro ◽  
Y. Hamakawa ◽  
R. Nakatani ◽  
H. Fukui
Keyword(s):  
Thermal Stability ◽  
Layer Thickness ◽  
Spin Valve ◽  
Thickness Dependence ◽  
Thermal Stability Of

Structural characterization and thermal stability of W/Si multilayers

1993 ◽  
Vol 8 (10) ◽  
pp. 2600-2607 ◽  
Author(s):  
M. Brunel ◽  
S. Enzo ◽  
M. Jergel ◽  
S. Luby ◽  
E. Majkova ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Layer Thickness ◽  
Thickness Ratio ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
X Ray ◽  
Layer Thickness Ratio ◽  
Transmission Electron ◽  
Thermal Stability Of ◽  
Beam Deposition

Tungsten/silicon multilayers with tungsten layers of a thickness of 1–2 nm were prepared by means of electron beam deposition. Their structure and thermal stability under rapid thermal annealing were investigated by a combination of x-ray diffraction techniques and cross-sectional transmission electron microscopy. The crystallization behavior was found to depend on the interdiffusion and mixing at the tungsten/silicon interfaces during deposition as well as during annealing. The as-deposited tungsten/silicon multilayers were amorphous and remained stable after annealing at 250 °C/40 s. Interdiffusion and crystallization occurred after annealing all samples from 500 °C/40 s up to 1000 °C/20 s. By performing the same heat treatment in the tungsten/silicon multilayers, the formation of body-centered cubic W was observed with a layer thickness ratio δW/δsi = 1, whereas tetragonal WSi2 was detected in tungsten/silicon multilayers with a layer thickness ratio of δw/δsi ∼0.25. This dependence of the crystallization products on the layer thickness ratio δw/δsi originates from the different phenomena of interdiffusion and mixing at the tungsten/silicon interfaces. The possible formation of bcc tungsten as a first stage of crystallization of tungsten-silicon amorphous phase, rich in tungsten, is discussed.

Improvement of thermal stability of exchange coupling in FeMn/NiFe films by Pt addition

2001 ◽  
Vol 89 (11) ◽  
pp. 7622-7624 ◽  
Author(s):  
Mutsuko Jimbo ◽  
Shingo Yokochi ◽  
Koji Yamagishi ◽  
Junichi Kurita
Keyword(s):  
Thermal Stability ◽  
Exchange Coupling ◽  
Thermal Stability Of
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