X-ray diffraction and Raman scattering study of SrBi2Ta2O9 ceramics and thin films with Bi3TiNbO9 addition

2001 ◽  
Vol 79 (23) ◽  
pp. 3827-3829 ◽  
Author(s):  
J. S. Zhu ◽  
H. X. Qin ◽  
Z. H. Bao ◽  
Y. N. Wang ◽  
W. Y. Cai ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study

EDS, XRD and Raman Scattering Study of Dy Ion Implanted CdTe Polycrystalline Thin Films

2011 ◽  
Vol 213 ◽  
pp. 157-160
Author(s):  
Juan Hou ◽  
Hai Bin Cao ◽  
Xu Chu Huang ◽  
Chun Yan Song
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
Polycrystalline Thin Film ◽  
X Ray ◽  
Polycrystalline Thin Films ◽  
Lattice Damage ◽  
Scattering Study ◽  
Ion Implanted

Dysprosium (Dy) ion implanted CdTe polycrystalline thin film (PTF) deposited on the ceramic substrate by the close spaced sublimation （CSS) method. Both the energy dispersive X-ray spectrometer（EDS）and Raman scattering analysis show that the as-deposited and Dy ion implanted CdTe PTF are non-stoichiometric with excess telluride. Furthermore, X-ray diffraction study reveals that the CdTe PTF forms a zinc-blended structure. In the Raman scattering analysis, the position of the peak on implantation does not change apparently whereas the intensity of the peak decreases owing to the lattice damage and increases as a result of thermal annealing. The data support that Raman activity is enhanced after Dy ion implantation.

Structrual Characterization and Raman Scattering of Epitaxial Aluminum Nitride Thin Films on Si(111)

1992 ◽  
Vol 242 ◽  
Author(s):  
W. J. Meng ◽  
T. A. Perry ◽  
J. Heremans ◽  
Y. T. Cheng
Keyword(s):  
Thin Films ◽  
Aluminum Nitride ◽  
Raman Scattering ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reactive Sputter Deposition ◽  
Transmission Electron ◽  
Substrate Temperatures

ABSTRACTThin films of aluminum nitride were grown epitaxially on Si(111) by ultra-high-vacuum dc magnetron reactive sputter deposition. Epitaxy was achieved at substrate temperatures of 600° C or above. We report results of film characterization by x-ray diffraction, transmission electron microscopy, and Raman scattering.

A combined X-ray diffraction and Raman scattering study of the phase transitions in Sr1−xCaxTiO3 (x=0.04, 0.06, and 0.12)

2005 ◽  
Vol 178 (9) ◽  
pp. 2846-2857 ◽  
Author(s):  
Sanjay Kumar Mishra ◽  
Rajeev Ranjan ◽  
Dhananjai Pandey ◽  
Pierre Ranson ◽  
Robert Ouillon ◽  
...  
Keyword(s):  
Phase Transitions ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study

In situ analysis of the crystallization process of Sb 2 S 3 thin films by Raman scattering and X-ray diffraction

2017 ◽  
Vol 121 ◽  
pp. 1-10 ◽  
Author(s):  
Romain Parize ◽  
Thomas Cossuet ◽  
Odette Chaix-Pluchery ◽  
Hervé Roussel ◽  
Estelle Appert ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
Crystallization Process ◽  
In Situ Analysis ◽  
X Ray Diffraction ◽  
X Ray

Investigations on nitrogen ion implantation effects in vacuum evaporated CdS thin films using Raman scattering and X-ray diffraction studies

2001 ◽  
Vol 304 (1-4) ◽  
pp. 175-180 ◽  
Author(s):  
K. Senthil ◽  
D. Mangalaraj ◽  
Sa.K. Narayandass ◽  
R. Kesavamoorthy ◽  
G.L.N. Reddy ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Implantation ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
Nitrogen Ion Implantation ◽  
X Ray ◽  
Cds Thin Films ◽  
Nitrogen Ion

High-resolution X-ray diffraction and micro-Raman scattering studies of Ge(:Ga) thin films grown on GaAs (001) substrates by MOCVD

RSC Advances ◽  
2016 ◽  
Vol 6 (58) ◽  
pp. 52575-52582 ◽  
Author(s):  
H. F. Liu ◽  
Y. J. Jin ◽  
C. G. Li ◽  
S. B. Dolmanan ◽  
S. Guo ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Raman Scattering ◽  
Cross Section ◽  
X Ray Diffraction ◽  
X Ray

Ga-doped Ge thin films grown on GaAs (001) substrates have been studied and compared with unintentionally doped Ge film by using HRXRD and Raman scattering in both surface and cross-section configurations.

X-Ray Diffraction and Raman Scattering Study of Sr1-xBi2+yTa2O9 Nanoparticles

2005 ◽  
pp. 3539-3542
Author(s):  
Yu Zhou ◽  
Hua Ke ◽  
De Chang Jia ◽  
W. Wang ◽  
J.C. Rao
Keyword(s):  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study
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