Atomic force microscopy inspection of the early state of formation of polymer surface relief gratings

2001 ◽  
Vol 79 (15) ◽  
pp. 2357-2359 ◽  
Author(s):  
O. Henneberg ◽  
Th. Geue ◽  
M. Saphiannikova ◽  
U. Pietsch ◽  
L. F. Chi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Relief ◽  
Polymer Surface ◽  
Force Microscopy ◽  
Early State ◽  
Atomic Force ◽  
Surface Relief Gratings

Fabrication of surface-relief gratings on an azobenzene-containing epoxy-based polymer film using atomic force microscopy

2010 ◽  
Vol 59 (10) ◽  
pp. 1422-1427 ◽  
Author(s):  
Raquel Fernández ◽  
Iñaki Zalakain ◽  
José Angel Ramos ◽  
María J Galante ◽  
Patricia A Oyanguren ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Film ◽  
Surface Relief ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Relief Gratings

Surface relief grating formation in luminescent dye doped photochromic polymer containing azobenzene side groups

Open Physics ◽  
2013 ◽  
Vol 11 (8) ◽  
Author(s):  
Lech Sznitko ◽  
Pawel Karpinski ◽  
Stanislaw Bartkiewicz ◽  
Andrzej Miniewicz ◽  
Jaroslaw Mysliwiec
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Relief ◽  
Rhodamine 6G ◽  
Thin Layers ◽  
Force Microscopy ◽  
Surface Relief Grating ◽  
Atomic Force ◽  
Photochromic Polymers ◽  
Photochromic Polymer ◽  
Grating Formation

AbstractWe study the formation of a surface relief grating and photoluminescence in a thin layers of a photochromic polymer doped with the luminescent dyes 3-(1,1-dicyanoethenyl)-1-phenyl-4,5-dihydro-1H-pyrazole and Rhodamine 6G. Surface topography measurements via Atomic Force Microscopy confirmed the existence of a surface relief grating with amplitudes as high as 650 nm both for doped and undoped photochromic polymers. Spectroscopic measurements carried out for polymers containing luminescent dyes have shown efficient photoluminescence and amplified spontaneous emission which is characteristic for gain media.

Atomic Force Microscopy of Industrial Polymers

1999 ◽  
Vol 5 (S2) ◽  
pp. 982-983
Author(s):  
Alan A. Galuska
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Polymer Surface ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Wear And Tear ◽  
Microscopic Morphology ◽  
Reliable Methods ◽  
Adhesion Friction

The performance of many industrial polymers is determined by the microscopic morphology of the polymers. For example, surface morphology can influence properties such as adhesion, friction, sealing, blocking, printability, wettability, and haze. Furthermore, bulk morphology often controls mechanical properties such as toughness. strength, wear, and tear resistance. In order to optimize polymer performance, quick reliable methods of determining surface and bulk morphology are essential.In the past, electron microscopy (in particular TEM) has been the primary method for determining polymer morphology. However, the usefulness of electron microscopy has been limited by the destructive nature of the electron beam, the naturally poor contrast between polymer types, and the difficulty in preparing (staining, etching, cryogenic ultramicrotoming, etc.) high quality specimens.Recently, the tapping phase-shift mode of atomic force microscopy (TPSAFM) has provided the polymer scientist with a simple, quick, flexible and quantitative method for determining polymer surface and bulk morphology.

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